Zobrazeno 1 - 10
of 22
pro vyhledávání: '"Cristiano, Forzan"'
Publikováno v:
International Symposium on Electromagnetic Compatibility - EMC EUROPE.
In modern digital ICs, the increasing demand for performance and throughput requires operating frequencies of hundreds of MHz, and in several cases exceeding the GHz range. Following the technology scaling trends, this request will continue to rise,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6a7a2e791672b57940d22a81607f8565
https://doi.org/10.1109/emceurope.2012.6396875
https://doi.org/10.1109/emceurope.2012.6396875
Publikováno v:
2012 IEEE 16th Workshop on Signal and Power Integrity (SPI).
Board-level I/Os' signal integrity and conducted EMI have become a critical concern for high-speed circuit designers, and a major cause of performance and reliability degradation of modern electronic systems. In this paper we investigate the impact o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6cdbb490e4f93a941751f0c7733d4d7c
https://doi.org/10.1109/sapiw.2012.6222922
https://doi.org/10.1109/sapiw.2012.6222922
Autor:
PATRICE JOUBERT DORIOL, VILLAVICENCIO AREVALO, YAMARITA DEL CARMEN, Cristiano, Forzan, Mario, Rotigni, Giovanni, Graziosi, Davide, Pandini
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______2153::aaf145a2d74e85b9bdd5ed75cb72e700
http://hdl.handle.net/11583/2263680
http://hdl.handle.net/11583/2263680
Autor:
Giovanni, Graziosi, PATRICE JOUBERT DORIOL, VILLAVICENCIO AREVALO, YAMARITA DEL CARMEN, Cristiano, Forzan, Mario, Rotigni, Davide, Pandini
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______2153::d649e179e0b5f2ab740d88cf592fb595
http://hdl.handle.net/11583/2264112
http://hdl.handle.net/11583/2264112
Autor:
PATRICE JOUBERT DORIOL, VILLAVICENCIO AREVALO, YAMARITA DEL CARMEN, Cristiano, Forzan, Mario, Rotigni, Giovanni, Graziosi, Davide, Pandini
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______2153::387c6522685915273fb6b8e4d28c1846
http://hdl.handle.net/11583/1876395
http://hdl.handle.net/11583/1876395
Autor:
Davide Pandini, Cristiano Forzan
Publikováno v:
Integration, the VLSI Journal
As the device and interconnect physical dimensions decrease steadily in modern nanometer silicon technologies, the ability to control the process and environmental variations is becoming more and more difficult. As a consequence, variability is a dom
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::633bd847c2d3789c46edd79d33c1df89
Autor:
Davide Pandini, Cristiano Forzan
Publikováno v:
ACM Great Lakes Symposium on VLSI
In signal integrity analysis, the joint effect of propagated noise through library cells, and of the noise injected on a quiet net by neighboring switching nets through coupling capacitances, must be considered in order to accurately estimate the ove
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::61a4bc6ae3635de1ac4e9c352a024c9e
https://doi.org/10.1145/1057661.1057734
https://doi.org/10.1145/1057661.1057734
Autor:
Davide Pandini, Cristiano Forzan
Publikováno v:
DATE
In signal integrity analysis, the joint effect of propagated noise through library cells, and of the noise injected on a quiet net by neighboring switching nets through coupling capacitances, must be considered in order to accurately estimate the ove
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9f36c46918af82ebff72a3505bfabf06
https://doi.org/10.1109/date.2005.215
https://doi.org/10.1109/date.2005.215
Publikováno v:
Proceedings of the IEEE 1998 Custom Integrated Circuits Conference (Cat. No.98CH36143).
A macromodel of the crosstalk effects between adjacent interconnects that takes into account the driver nonlinear behavior is presented in this paper. The macromodel is obtained by combining a reduced order representation of the equivalent impedance
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::46594d79c54ab11bd54c7ef4c59339f6
https://doi.org/10.1109/cicc.1998.694963
https://doi.org/10.1109/cicc.1998.694963
Publikováno v:
ISQED
Interconnect parasitic effects are one of the limiting factors for the performances of deep submicron VLSI designs, where the interconnect induced delay, dominates over the gate delay. Furthermore, as coupling capacitance between wires increases due
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6dc56705524183ce82ebf788c126ca20
https://doi.org/10.1109/isqed.2000.838935
https://doi.org/10.1109/isqed.2000.838935