Zobrazeno 1 - 10
of 288
pro vyhledávání: '"Cristian, Mocuta"'
Autor:
Vincent Jacquemain, Christophe Cheuleu, Nicolas Ranc, Olivier Castelnau, Vincent Michel, Doriana Vinci, Véronique Favier, Cristian Mocuta, Dominique Thiaudiere
Publikováno v:
Journal of Synchrotron Radiation, Vol 31, Iss 1, Pp 17-27 (2024)
In the energy production and transportation industries, numerous metallic structures may be subjected to at least several billions of cycles, i.e. loaded in the very high cycle fatigue domain (VHCF). Therefore, to design structures in the VHCF domain
Externí odkaz:
https://doaj.org/article/bf78d74bd793411ab77ce5d35759fd07
Autor:
Kewin Desjardins, Cristian Mocuta, Arkadiusz Dawiec, Solenn Réguer, Philippe Joly, Jean-Michel Dubuisson, Filipe Alves, Arafat Noureddine, Frédéric Bompard, Dominique Thiaudière
Publikováno v:
Journal of Synchrotron Radiation, Vol 29, Iss 1, Pp 180-193 (2022)
One of the challenges of all synchrotron facilities is to offer the highest performance detectors for all their specific experiments, in particular for X-ray diffraction imaging and its high throughput data collection. In that context, the DiffAbs be
Externí odkaz:
https://doaj.org/article/f94d441b258c4b5d9c3170b77a4bcc58
Autor:
Rebecca Chahine, Martina Tomelleri, Jessy Paterson, Mathieu Bernard, Nicolas Bernier, François Pierre, Denis Rouchon, Audrey Jannaud, Cristian Mocuta, Valentina M. Giordano, Françoise Hippert, Pierre Noé
Publikováno v:
Journal of Materials Chemistry C. 11:269-284
Engineering of chalcogenide phase-change materials at the nanoscale is required to improve the performances of ultimate size memory devices and reduce their power consumption.
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Autor:
Eloïse Rahier, Sijia Ran, Nicolas Ratel Ramond, Shuangying Ma, Lionel Calmels, Sabyasachi Saha, Cristian Mocuta, Daniel Benoit, Yannick Le Friec, Minh Anh Luong, Alain Claverie
Publikováno v:
ACS Applied Electronic Materials. 4:2682-2688
Publikováno v:
Materials, Vol 13, Iss 18, p 4027 (2020)
Ni and Ni(W) solid solution of bulk Ni and Ni-W alloys (Ni-10W, Ni-30W, and Ni-50W) (wt%) were mechanically compared through the evolution of their {111} X-ray diffraction peaks during in situ tensile tests on the DiffAbs beamline at the Synchrotron
Externí odkaz:
https://doaj.org/article/c0fe260ebc2449d7bd7694c7d560df52
Autor:
Thomas W. Cornelius, Cristian Mocuta, Stéphanie Escoubas, Luiz R. M. Lima, Eudes B. Araújo, Andrei L. Kholkin, Olivier Thomas
Publikováno v:
Materials, Vol 13, Iss 15, p 3338 (2020)
The piezoelectric properties of lanthanum-modified lead zirconate titanate Pb1−xLax(Zr0.52Ti0.48)1−x/4O3 thin films, with x = 0, 3 and 12 mol% La, were studied by in situ synchrotron X-ray diffraction under direct (DC) and alternating (AC) electr
Externí odkaz:
https://doaj.org/article/27439ad152e941b9babf50425b00f51e
Autor:
Mouaad Yassine Aliouat, Dmitriy Ksenzov, Stephanie Escoubas, Jörg Ackermann, Dominique Thiaudière, Cristian Mocuta, Mohamed Cherif Benoudia, David Duche, Olivier Thomas, Souren Grigorian
Publikováno v:
Materials, Vol 13, Iss 14, p 3092 (2020)
We describe the impact of tensile strains on the structural properties of thin films composed of PffBT4T-2OD π-conjugated polymer and PC71BM fullerenes coated on a stretchable substrate, based on a novel approach using in situ studies of flexible or
Externí odkaz:
https://doaj.org/article/6ebf503c060b49499303eb65a80e86b2
Autor:
Rajkiran Tholapi, Manon Gallard, Nelly Burle, Christophe Guichet, Stephanie Escoubas, Magali Putero, Cristian Mocuta, Marie-Ingrid Richard, Rebecca Chahine, Chiara Sabbione, Mathieu Bernard, Leila Fellouh, Pierre Noé, Olivier Thomas
Publikováno v:
Nanomaterials, Vol 10, Iss 6, p 1247 (2020)
Phase change materials are attractive materials for non-volatile memories because of their ability to switch reversibly between an amorphous and a crystal phase. The volume change upon crystallization induces mechanical stress that needs to be unders
Externí odkaz:
https://doaj.org/article/084acc192165421a9c9bd9245e7c3f9c
Autor:
Andrea Somogyi, Cristian Mocuta
Publikováno v:
AIMS Materials Science, Vol 2, Iss 2, Pp 122-162 (2015)
Scanning hard X-ray spectro-microscopic imaging opens unprecedented possibilities in the study of inhomogeneous samples at different length-scales. It gives insight into the spatial variation of the major and minor components, impurities and dopants
Externí odkaz:
https://doaj.org/article/97e6a294c3634830bd3bf2e4a3cf2062