Is there a limit when the access resistance impact on the extraction of key GAA NS FETs devices parameters can (not) be avoided?

Autor: Tahiat, A., Cretu, B., Veloso, A., Simoen, E.

Publikováno v: In Solid State Electronics November 2023 209

In-depth static and low frequency noise assessment of p-channel gate-all-around vertically stacked silicon nanosheets

Autor: Cretu, B., Veloso, A., Simoen, E.

Publikováno v: In Solid State Electronics March 2023 201

Detailed low frequency noise assessment on GAA NW n-channel FETs

Autor: Cretu, B., Bordin, A., Simoen, E., Hellings, G., Linten, D., Claeys, C.

Publikováno v: In Solid State Electronics August 2021 181-182

Improved physics-based analysis to discriminate the flicker noise origin at very low temperature and drain voltage polarization

Autor: Cretu, B., Boudier, D., Simoen, E., Veloso, A., Collaert, N., Claeys, C.

Publikováno v: In Solid State Electronics September 2020 171

Predictive Factors for Total Knee Arthroplasty: An Observational Study.

Autor: Iordache S; Orthopaedics and Traumatology, Bucharest Emergency University Hospital, Bucharest, ROU., Cursaru A; Orthopaedics and Traumatology, Bucharest Emergency University Hospital, Bucharest, ROU., Cretu B; Orthopaedics and Traumatology, Bucharest Emergency University Hospital, Bucharest, ROU., Niculae CF; Molecular Pathology, Bucharest Emergency University Hospital, Bucharest, ROU., Popa M; Orthopaedics and Traumatology, Bucharest Emergency University Hospital, Bucharest, ROU., Costache MA; Orthopaedics and Traumatology, Bucharest Emergency University Hospital, Bucharest, ROU., Serban B; Orthopaedics and Traumatology, Bucharest Emergency University Hospital, Bucharest, ROU., Cirstoiu C; Orthopaedics and Traumatology, Bucharest Emergency University Hospital, Bucharest, ROU.

Publikováno v: Cureus [Cureus] 2024 Aug 22; Vol. 16 (8), pp. e67519. Date of Electronic Publication: 2024 Aug 22 (Print Publication: 2024).