Zobrazeno 1 - 10
of 11
pro vyhledávání: '"Crespillo ML"'
Publikováno v:
267 (2009): 1460–1463.
info:cnr-pdr/source/autori:Rivera A, Olivares J, Crespillo ML, Garcia G, Bianconi M, Agullo-Lopez F/titolo:Assessment of swift-ion damage by RBS%2FC: Determination of the amorphization threshold/doi:/rivista:/anno:2009/pagina_da:1460/pagina_a:1463/intervallo_pagine:1460–1463/volume:267
info:cnr-pdr/source/autori:Rivera A, Olivares J, Crespillo ML, Garcia G, Bianconi M, Agullo-Lopez F/titolo:Assessment of swift-ion damage by RBS%2FC: Determination of the amorphization threshold/doi:/rivista:/anno:2009/pagina_da:1460/pagina_a:1463/intervallo_pagine:1460–1463/volume:267
A theoretical strategy is developed to quantitatively assess the ion-beam damage as measured by Rutherford-backscattering spectrometry under channeling conditions (RBS/C) in LiNbO3 crystals. The approach is based on a recent exciton decay model to ca
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=cnr_________::faa6bfcb31a4bf2b8bdd692fadd99a36
https://publications.cnr.it/doc/36540
https://publications.cnr.it/doc/36540
Akademický článek
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Akademický článek
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Autor:
Borrell-Grueiro O; Departamento de Química Física, Universidad Complutense de Madrid, Avenida Complutense s/n, E-28040 Madrid, Spain.; Instituto de Fusión Nuclear 'Guillermo Velarde,' Universidad Politécnica de Madrid, C/ José Gutiérrez Abascal 2, E-28006 Madrid, Spain., Mendez-González Y; Instituto de Fusión Nuclear 'Guillermo Velarde,' Universidad Politécnica de Madrid, C/ José Gutiérrez Abascal 2, E-28006 Madrid, Spain., Crespillo ML; Centro de Microanálisis de Materiales, Universidad Autónoma de Madrid (CMAM-UAM), Cantoblanco, E-28049 Madrid, Spain., Olivares J; Centro de Microanálisis de Materiales, Universidad Autónoma de Madrid (CMAM-UAM), Cantoblanco, E-28049 Madrid, Spain.; Instituto de Óptica 'Daza de Valdés,' Consejo Superior de Investigaciones Científicas (IO-CSIC), C/Serrano 121, E-28006 Madrid, Spain., Ramos-Ramos DJ; Instituto de Fusión Nuclear 'Guillermo Velarde,' Universidad Politécnica de Madrid, C/ José Gutiérrez Abascal 2, E-28006 Madrid, Spain., Junquera E; Departamento de Química Física, Universidad Complutense de Madrid, Avenida Complutense s/n, E-28040 Madrid, Spain., Bañares L; Departamento de Química Física, Universidad Complutense de Madrid, Avenida Complutense s/n, E-28040 Madrid, Spain.; Instituto Madrileño de Estudios Avanzados en Nanociencia (IMDEA Nanoscience), Cantoblanco, E-28049 Madrid, Spain., Guerrero-Martínez A; Departamento de Química Física, Universidad Complutense de Madrid, Avenida Complutense s/n, E-28040 Madrid, Spain., Rivera A; Instituto de Fusión Nuclear 'Guillermo Velarde,' Universidad Politécnica de Madrid, C/ José Gutiérrez Abascal 2, E-28006 Madrid, Spain., Peña-Rodríguez O; Instituto de Fusión Nuclear 'Guillermo Velarde,' Universidad Politécnica de Madrid, C/ José Gutiérrez Abascal 2, E-28006 Madrid, Spain.
Publikováno v:
The Journal of chemical physics [J Chem Phys] 2024 Aug 07; Vol. 161 (5).
Autor:
Sánchez-Pérez F; Instituto de Fusión Nuclear 'Guillermo Velarde', Universidad Politécnica de Madrid, José Gutiérrez Abascal 2, E-28006, Madrid, Spain., Borrell-Grueiro O; Departamento de Química Física, Universidad Complutense de Madrid, Avenida Complutense s/n, 28040, Madrid, Spain.; INSTEC, Universidad de la Habana, Avenida Salvador Allende 1110, 6163, 10400, Habana, Cuba., Casasnovas-Melián A; Departamento de Química Física, Universidad Complutense de Madrid, Avenida Complutense s/n, 28040, Madrid, Spain., Ramos-Ramos DJ; Instituto de Fusión Nuclear 'Guillermo Velarde', Universidad Politécnica de Madrid, José Gutiérrez Abascal 2, E-28006, Madrid, Spain., Guerrero-Martínez A; Departamento de Química Física, Universidad Complutense de Madrid, Avenida Complutense s/n, 28040, Madrid, Spain., Bañares L; Departamento de Química Física, Universidad Complutense de Madrid, Avenida Complutense s/n, 28040, Madrid, Spain.; Instituto Madrileño de Estudios Avanzados en Nanociencia (IMDEA Nanoscience), Cantoblanco, 28049, Madrid, Spain., Prada A; Departamento de Computación e Industrias, Facultad de Ciencias de la Ingeniería, Universidad Católica del Maule, Talca, Chile., Valencia FJ; Departamento de Computación e Industrias, Facultad de Ciencias de la Ingeniería, Universidad Católica del Maule, Talca, Chile.; Centro de Innovaciön en Ingeniería Aplicada (CIIA), Facultad de Ciencias de la Ingeniería, Universidad Catölica del Maule, Talca, Chile., Kohanoff J; Instituto de Fusión Nuclear 'Guillermo Velarde', Universidad Politécnica de Madrid, José Gutiérrez Abascal 2, E-28006, Madrid, Spain., Crespillo ML; Centro de Micro-Análisis de Materiales, Universidad Autónoma de Madrid, Madrid, E-28049, Spain., Olivares J; Centro de Micro-Análisis de Materiales, Universidad Autónoma de Madrid, Madrid, E-28049, Spain.; Instituto de Óptica 'Daza de Valdés' (CSIC), Serrano 121, Madrid, E-28006, Spain., Rivera A; Instituto de Fusión Nuclear 'Guillermo Velarde', Universidad Politécnica de Madrid, José Gutiérrez Abascal 2, E-28006, Madrid, Spain.; Departamento de Ingeniería Energética, ETSII Industriales, Universidad Politécnica de Madrid, José Gutiérrez Abascal 2, E-28006, Madrid, Spain., Peña-Rodríguez O; Instituto de Fusión Nuclear 'Guillermo Velarde', Universidad Politécnica de Madrid, José Gutiérrez Abascal 2, E-28006, Madrid, Spain.; Departamento de Ingeniería Energética, ETSII Industriales, Universidad Politécnica de Madrid, José Gutiérrez Abascal 2, E-28006, Madrid, Spain.
Publikováno v:
Nanophotonics (Berlin, Germany) [Nanophotonics] 2024 Feb 16; Vol. 13 (7), pp. 1149-1157. Date of Electronic Publication: 2024 Feb 16 (Print Publication: 2024).
Autor:
Jiang L; Department of Nuclear Engineering and Radiological Sciences, University of Michigan, Ann Arbor, MI, 48109, USA., Hu YJ; Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI, 48109, USA., Sun K; Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI, 48109, USA., Xiu P; Department of Nuclear Engineering and Radiological Sciences, University of Michigan, Ann Arbor, MI, 48109, USA., Song M; Department of Nuclear Engineering and Radiological Sciences, University of Michigan, Ann Arbor, MI, 48109, USA., Zhang Y; Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN, 37996, USA.; Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA., Boldman WL; Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN, 37996, USA., Crespillo ML; Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN, 37996, USA., Rack PD; Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN, 37996, USA.; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA., Qi L; Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI, 48109, USA., Weber WJ; Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN, 37996, USA.; Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA., Wang L; Department of Nuclear Engineering and Radiological Sciences, University of Michigan, Ann Arbor, MI, 48109, USA.; Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI, 48109, USA.
Publikováno v:
Advanced materials (Deerfield Beach, Fla.) [Adv Mater] 2020 Oct; Vol. 32 (39), pp. e2002652. Date of Electronic Publication: 2020 Aug 20.
Autor:
Zhang Y; Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, United States of America. Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN 37996, United States of America., Tunes MA, Crespillo ML, Zhang F, Boldman WL, Rack PD, Jiang L, Xu C, Greaves G, Donnelly SE, Wang L, Weber WJ
Publikováno v:
Nanotechnology [Nanotechnology] 2019 Jul 19; Vol. 30 (29), pp. 294004. Date of Electronic Publication: 2019 Apr 04.
Improved high temperature radiation damage tolerance in a three-phase ceramic with heterointerfaces.
Autor:
Ohtaki KK; Department of Chemical Engineering & Materials Science, University of California, Irvine, Irvine, CA, 92697-2575, USA., Patel MK; Department of Mechanical, Materials & Aerospace Engineering, University of Liverpool, Liverpool, L69 3BX, UK.; Department of Materials Science and Engineering, University of Tennessee, Knoxville, Knoxville, 37996-2100, TN, USA., Crespillo ML; Department of Materials Science and Engineering, University of Tennessee, Knoxville, Knoxville, 37996-2100, TN, USA.; Ion Beam Materials Laboratory, University of Tennessee, Knoxville, Knoxville, 37996, TN, USA., Karandikar KK; Department of Mechanical and Aerospace Engineering, University of California, San Diego, San Diego, CA, 92093-0411, USA., Zhang Y; Department of Materials Science and Engineering, University of Tennessee, Knoxville, Knoxville, 37996-2100, TN, USA.; Ion Beam Materials Laboratory, University of Tennessee, Knoxville, Knoxville, 37996, TN, USA., Graeve OA; Department of Mechanical and Aerospace Engineering, University of California, San Diego, San Diego, CA, 92093-0411, USA., Mecartney ML; Department of Chemical Engineering & Materials Science, University of California, Irvine, Irvine, CA, 92697-2575, USA. martham@uci.edu.
Publikováno v:
Scientific reports [Sci Rep] 2018 Sep 18; Vol. 8 (1), pp. 13993. Date of Electronic Publication: 2018 Sep 18.
Autor:
Rivera A; Instituto de Fusión Nuclear, Universidad Politécnica de Madrid, José Gutiérrez Abascal 2, Madrid, E-28006, Spain. antonio.rivera@upm.es., Olivares J; Centro de Microanálisis de Materiales, Universidad Autónoma de Madrid, Madrid, E-28049, Spain.; Instituto de Óptica 'Daza de Valdés' (CSIC), Serrano 121, Madrid, E-28006, Spain., Prada A; Instituto de Fusión Nuclear, Universidad Politécnica de Madrid, José Gutiérrez Abascal 2, Madrid, E-28006, Spain., Crespillo ML; Centro de Microanálisis de Materiales, Universidad Autónoma de Madrid, Madrid, E-28049, Spain., Caturla MJ; Departamento de Física Aplicada, Facultad de Ciencias, Fase II, Universidad de Alicante, Alicante, E-03690, Alicante, Spain., Bringa EM; CONICET and Facultad de Ciencias Exactas y Naturales, Universidad Nacional de Cuyo, Mendoza, 5500, Argentina., Perlado JM; Instituto de Fusión Nuclear, Universidad Politécnica de Madrid, José Gutiérrez Abascal 2, Madrid, E-28006, Spain., Peña-Rodríguez O; Instituto de Fusión Nuclear, Universidad Politécnica de Madrid, José Gutiérrez Abascal 2, Madrid, E-28006, Spain.
Publikováno v:
Scientific reports [Sci Rep] 2017 Sep 06; Vol. 7 (1), pp. 10641. Date of Electronic Publication: 2017 Sep 06.
Autor:
Crespillo ML; Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee 37996, USA., Graham JT; Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee 37996, USA., Zhang Y; Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee 37996, USA., Weber WJ; Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee 37996, USA.
Publikováno v:
The Review of scientific instruments [Rev Sci Instrum] 2016 Feb; Vol. 87 (2), pp. 024902.