Single event upset (SEU) sensitivity dependence of linear integrated circuits (ICs)...

Autor: Penzin, S.H., Crawford, K.B., Crain, W.R., Moss, S.C., Pinkerton, S.D., LaLumondiere, S.D., Maher, M.C.

Publikováno v: IEEE Transactions on Nuclear Science. Dec97 Part 1 of 3, Vol. 44 Issue 6, p2325. 8p. 7 Diagrams, 3 Charts, 13 Graphs.

SEE sensitivity determination of high-density DRAMs with limited-range heavy ions.

Autor: Koga, R., Crain, S.H., Yu, P., Crawford, K.B.

Publikováno v: 2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record. Held in Conjunction with IEEE Nuclear & Space Radiation Effects Conference (Cat. No.01TH8588); 2001, p182-189, 8p

Comparison of flight and ground data for radiation-induced high current states in the 68302 microprocessor.

Autor: Crain, S.H., La Lumondiere, S.D., Miller, S.W., Crain, W.R., Crawford, K.B., Hansel, S.J., Koga, R., Moss, S.C.

Publikováno v: 2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear & Space Radiation Effects Conference (Cat. No.00TH8527); 2000, p85-88, 4p

SEE sensitivity determination of high-density DRAMs with limited-range heavy ions.

Autor: Koga, R., Crain, S.H., Yu, P., Crawford, K.B.

Publikováno v: 2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear & Space Radiation Effects Conference (Cat. No.00TH8527); 2000, p45-52, 8p

Single ion induced multiple-bit upset in IDT 256K SRAMs.

Autor: Koga, R., Crawford, K.B., Grant, P.B., Kolasinski, W.A., Leung, D.L., Lie, T.J., Mayer, D.C., Pinkerton, S.D., Tsubota, T.K.

Publikováno v: RADECS 93 Second European Conference on Radiation & its Effects on Components & Systems (Cat No93TH0616-3); 1993, p485-489, 5p