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of 65
pro vyhledávání: '"Cowie, Megan"'
Autor:
Cowie, Megan, Constantinou, Procopios C., Curson, Neil J., Stock, Taylor J. Z., Grutter, Peter
We use electrostatic force microscopy to spatially resolve random telegraph noise at the Si/SiO$_2$ interface. Our measurements demonstrate that two-state fluctuations are localized at interfacial traps, with bias-dependent rates and amplitudes. Thes
Externí odkaz:
http://arxiv.org/abs/2403.07251
The Si/SiO$_2$ interface is populated by isolated trap states which modify its electronic properties. These traps are of critical interest for the development of semiconductor-based quantum sensors and computers, as well as nanoelectronic devices. He
Externí odkaz:
http://arxiv.org/abs/2306.13648
In this work, we experimentally demonstrate two-state fluctuations in a metal-insulator-semiconductor (MIS) device formed out of a metallic atomic force microscopy tip, vacuum gap, and multilayer MoSe$_2$ sample. We show that noise in this device is
Externí odkaz:
http://arxiv.org/abs/2109.15275
Autor:
Plougmann, Rikke, Cowie, Megan, Benkirane, Yacine, Schué, Léonard, Schumacher, Zeno, Grütter, Peter
Transition metal dichalcogenides (TMDCs) have attracted significant attention for optoelectronic, photovoltaic and photoelectrochemical applications. The properties of TMDCs are highly dependent on the number of stacked atomic layers, which is usuall
Externí odkaz:
http://arxiv.org/abs/2109.05354
Autor:
Schumacher, Zeno, Rejali, Rasa, Cowie, Megan, Spielhofer, Andreas, Miyahara, Yoichi, Grutter, Peter
Inducing an inversion layer in organic semiconductors is a highly nontrivial, but critical, achievement for producing organic field-effect transistor (OFET) devices, which rely on the generation of inversion, accumulation, and depletion regimes for s
Externí odkaz:
http://arxiv.org/abs/2008.01562
Akademický článek
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Autor:
Cowie, Megan1 megan.cowie@mail.mcgill.ca, Constantinou, Procopios C.2, Curson, Neil J.2,3, Stock, Taylor J. Z.2,3, Grütter, Peter1
Publikováno v:
Proceedings of the National Academy of Sciences of the United States of America. 10/29/2024, Vol. 121 Issue 44, p1-8. 11p.
Autor:
Cowie, Megan E., Kim, Hyoun S., Hodgins, David C., McGrath, Daniel S., Scanavino, Marco De Tubino, Tavares, Hermano
Publikováno v:
Journal of Behavioral Addictions. 8(3):451-462
Externí odkaz:
https://www.ceeol.com/search/article-detail?id=799108