Zobrazeno 1 - 5
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pro vyhledávání: '"Coutet, Julien"'
Publikováno v:
In Microelectronics Reliability July 2023 146
Autor:
Coutet, Julien, Doche, Emmanuel, Guetard, Romain, Janvresse, Aurelien, Lavagne, Suzel, Lebosse, Pierre, Pastre, Antonin, Sarlotte, Michel, Moreau, Christian, Marc, François, Bayle, Franck
Publikováno v:
In Microelectronics Reliability September 2019 100-101
Autor:
Coutet, Julien, Marc, François, Dozolme, Flavien, Guétard, Romain, Janvresse, Aurélien, Lebossé, Pierre, Pastre, Antonin, Clement, Jean-Claude
Publikováno v:
In Microelectronics Reliability September 2018 88-90:61-66
Autor:
Coutet, Julien
Publikováno v:
Electronique. Université de Bordeaux, 2020. Français. ⟨NNT : 2020BORD0130⟩
The downscaling of transistors in commercial electronic circuits has been permitted by the use of new materials in gate oxide (especially for DSM bound). In order to fully trust this kind of chips in extreme environments, it is necessary to make a pr
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https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::675d90dab723fe26d9af6e12cf81ac51
https://tel.archives-ouvertes.fr/tel-03352879
https://tel.archives-ouvertes.fr/tel-03352879
