Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Coupin MJ"'
Autor:
Nibhanupudi SST; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, United States., Roy A; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, United States.; Department of Physics, Birla Institute of Technology Mesra, Ranchi, Jharkhand 835215, India., Chowdhury S; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, United States., Schalip R; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, United States., Coupin MJ; Texas Materials Institute, The University of Texas at Austin, Austin, Texas 78712, United States., Matthews KC; Texas Materials Institute, The University of Texas at Austin, Austin, Texas 78712, United States., Alam MH; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, United States., Satpati B; Surface Physics and Material Science Division, Saha Institute of Nuclear Physics, 1/AF, Bidhannagar, Kolkata 700 064, India., Movva HCP; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, United States., Luth CJ; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, United States., Wu S; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, United States., Warner JH; Texas Materials Institute, The University of Texas at Austin, Austin, Texas 78712, United States., Banerjee SK; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, United States.
Publikováno v:
ACS applied materials & interfaces [ACS Appl Mater Interfaces] 2024 May 01; Vol. 16 (17), pp. 22326-22333. Date of Electronic Publication: 2024 Apr 18.
Autor:
Wen Y; Department of Materials, University of Oxford, Oxford OX1 3PH, United Kingdom., Coupin MJ; Materials Science and Engineering Program, Texas Materials Institute, The University of Texas at Austin, Austin, Texas 78712, United States., Hou L; Department of Materials, University of Oxford, Oxford OX1 3PH, United Kingdom., Warner JH; Materials Science and Engineering Program, Texas Materials Institute, The University of Texas at Austin, Austin, Texas 78712, United States.; Walker Department of Mechanical Engineering, The University of Texas at Austin, Austin, Texas 78712, United States.
Publikováno v:
ACS nano [ACS Nano] 2023 Oct 24; Vol. 17 (20), pp. 19600-19612. Date of Electronic Publication: 2023 Oct 04.
Autor:
Coupin MJ; Materials Science and Engineering Program, Texas Materials Institute, The University of Texas at Austin, Austin, Texas 78712, United States., Wen Y; Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, United Kingdom., Lee S; Department of Materials Science & Engineering, Seoul National University, Seoul 08826, Republic of Korea.; Research Institute of Advanced Materials, Seoul National University, Seoul 08826, Republic of Korea., Saxena A; Walker Department of Mechanical Engineering, The University of Texas at Austin, Austin, Texas 78712, United States.; Oden Institute for Computational Engineering and Sciences, The University of Texas at Austin, Austin, Texas 78712, United States., Ophus C; National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, One Cyclotron Road, Building 67, Berkeley, California 94720, United States., Allen CS; Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, United Kingdom.; Electron Physical Science Imaging Centre, Diamond Light Source Ltd., Didcot OX11 0DE, U.K., Kirkland AI; Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, United Kingdom.; Electron Physical Science Imaging Centre, Diamond Light Source Ltd., Didcot OX11 0DE, U.K.; Rosalind Franklin Institute, Harwell Science and Innovation Campus, Didcot OX11 0QX, U.K., Aluru NR; Materials Science and Engineering Program, Texas Materials Institute, The University of Texas at Austin, Austin, Texas 78712, United States.; Walker Department of Mechanical Engineering, The University of Texas at Austin, Austin, Texas 78712, United States.; Oden Institute for Computational Engineering and Sciences, The University of Texas at Austin, Austin, Texas 78712, United States., Lee GD; Department of Materials Science & Engineering, Seoul National University, Seoul 08826, Republic of Korea.; Research Institute of Advanced Materials, Seoul National University, Seoul 08826, Republic of Korea., Warner JH; Materials Science and Engineering Program, Texas Materials Institute, The University of Texas at Austin, Austin, Texas 78712, United States.; Walker Department of Mechanical Engineering, The University of Texas at Austin, Austin, Texas 78712, United States.
Publikováno v:
Nano letters [Nano Lett] 2023 Aug 09; Vol. 23 (15), pp. 6807-6814. Date of Electronic Publication: 2023 Jul 24.
Autor:
Song M; Microelectronic Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, United States., Lee S; Microelectronic Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, United States., Nibhanupudi SST; Microelectronic Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, United States., Singh JV; Microelectronic Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, United States., Disiena M; Microelectronic Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, United States., Luth CJ; Microelectronic Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, United States., Wu S; Microelectronic Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, United States., Coupin MJ; Department of Mechanical Engineering, The University of Texas at Austin, Austin, Texas 78712, United States., Warner JH; Department of Mechanical Engineering, The University of Texas at Austin, Austin, Texas 78712, United States., Banerjee SK; Microelectronic Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, United States.
Publikováno v:
Nano letters [Nano Lett] 2023 Apr 12; Vol. 23 (7), pp. 2952-2957. Date of Electronic Publication: 2023 Mar 30.
Autor:
Lu Y; Department of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH, UK., Chen J; Department of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH, UK., Coupin MJ; Material Sciences and Engineering Program, Texas Materials Institute, The University of Texas at Austin, Austin, Texas, 78712, USA.; Department of Mechanical Engineering, The University of Texas at Austin, Austin, Texas, 78712, USA., Sinha S; Department of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH, UK., Warner JH; Material Sciences and Engineering Program, Texas Materials Institute, The University of Texas at Austin, Austin, Texas, 78712, USA.; Department of Mechanical Engineering, The University of Texas at Austin, Austin, Texas, 78712, USA.
Publikováno v:
Advanced materials (Deerfield Beach, Fla.) [Adv Mater] 2022 Oct; Vol. 34 (43), pp. e2205403. Date of Electronic Publication: 2022 Sep 25.
Autor:
Hazra, Arnab, Gakhar, Teena
Publikováno v:
Journal of Materials Science: Materials in Electronics; Sep2023, Vol. 34 Issue 26, p1-10, 10p