Zobrazeno 1 - 10
of 1 279
pro vyhledávání: '"Cote, W. A."'
Autor:
BENICHOU, Saida
L'objet de cette étude est l'identification des éléments radioactifs existant dans quatre type d'échantillon de sable ont été recueillies à partir des différents régions de la wilaya de Tlemcen, et réalisée à l'aide d'une chaine de spectr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______2678::064beddc78fe2a57e027831f9bdb3f57
http://dspace.univ-tlemcen.dz/handle/112/5011
http://dspace.univ-tlemcen.dz/handle/112/5011
Autor:
Gannot, Israel, Roodenko, Katy, Barton, J. B., Carver, G. E., Chanda, S. K., Cote, W. J., Locknar, Sarah, Gupta, Manish
Publikováno v:
Proceedings of SPIE; March 2022, Vol. 11953 Issue: 1 p119530G-119530G-7, 1075778p
Autor:
Callaghan, T.V.
Publikováno v:
Journal of Applied Ecology. Apr85, Vol. 22 Issue 1, p306-308. 3p.
Autor:
Park, Jung Hwan1 (AUTHOR), Pattipaka, Srinivas2 (AUTHOR), Hwang, Geon-Tae2 (AUTHOR), Park, Minok3 (AUTHOR), Woo, Yu Mi1 (AUTHOR), Kim, Young Bin4 (AUTHOR), Lee, Han Eol5 (AUTHOR), Jeong, Chang Kyu5 (AUTHOR), Zhang, Tiandong6,7 (AUTHOR), Min, Yuho8 (AUTHOR), Park, Kwi-Il8 (AUTHOR) kipark@knu.ac.kr, Lee, Keon Jae4 (AUTHOR) keonlee@kaist.ac.kr, Ryu, Jungho9 (AUTHOR) jhryu@ynu.ac.kr
Publikováno v:
Nano-Micro Letters. 8/26/2024, Vol. 16 Issue 1, p1-47. 47p.
Autor:
Tankou Ntahayo, Celestin Patrick1 (AUTHOR), Mabekou Takam, Jeanne Sandrine1 (AUTHOR), Kouefouet, Hervice1 (AUTHOR) hervicekouefouet@yahoo.fr, Foadieng, Emmanuel2 (AUTHOR), Pitti, Rostand Moutou3,4 (AUTHOR), Talla, Pierre Kisito1 (AUTHOR), Biscaia, Hugo C. (AUTHOR)
Publikováno v:
Advances in Materials Science & Engineering. 6/29/2024, Vol. 2024, p1-12. 12p.
Autor:
Karthikeyan, M., Cote, W., Medina, L., Shiling, E., Gasasira, A., Henning, A., Ferrante, W., Craig, M., Merbeth, T.
Publikováno v:
2008 IEEE International Conference on Microelectronic Test Structures; 2008, p56-61, 6p
Autor:
Karthikeyan, M., Fox, S., Cote, W., Yeric, G., Hall, M., Garcia, J., Mitchell, B., Wolf, E., Agarwal, S.
Publikováno v:
2006 IEEE International Conference on Microelectronic Test Structures; 2006, p104-109, 6p
Autor:
Edelstein, D., Rathore, H., Davis, C., Clevenger, L., Cowley, A., Nogami, T., Agarwala, B., Arai, S., Carbone, A., Chanda, K., Chen, F., Cohen, S., Cote, W., Cullinan, M., Dalton, T., Das, S., Davis, P., Demarest, J., Dunn, D., Dziobkowski, C.
Publikováno v:
Proceedings of the 2004 IEEE International Reliability Physics Symposium; 2004, p316-319, 4p
Autor:
Edelstein, D., Heidenreich, J., Goldblatt, R., Cote, W., Uzoh, C., Lustig, N., Roper, P., McDevitt, T., Motsiff, W., Simon, A., Dukovic, J., Wachnik, R., Rathore, H., Schulz, R., Su, L., Luce, S., Slattery, J.
Publikováno v:
International Electron Devices Meeting IEDM Technical Digest; 1997, p773-776, 4p