Interface instabilities and electronic properties of ZrO2 on silicon (100).

Autor: Fulton, C. C., Cook Jr., T. F., Lucovsky, G., Nemanich, R. J.

Publikováno v: Journal of Applied Physics; 9/1/2004, Vol. 96 Issue 5, p2665-2673, 9p, 1 Diagram, 4 Charts, 8 Graphs