Zobrazeno 1 - 10
of 27
pro vyhledávání: '"Constantinos Xanthopoulos"'
Publikováno v:
2022 IEEE International Test Conference (ITC).
Autor:
Vijayakumar Thangamariappan, Nidhi Agrawal, Jason Kim, Constantinos Xanthopoulos, Ken Butler, Ira Leventhal, Joe Xiao
Publikováno v:
2022 IEEE International Test Conference (ITC).
Autor:
Constantinos Xanthopoulos, Arnold Neckermann, Klaus-Peter Tschernay, Peter Sarson, Yiorgos Makris, Paulus List
Publikováno v:
IEEE Transactions on Device and Materials Reliability. 20:295-307
Ensuring high reliability in modern integrated circuits (ICs) requires the employment of several die screening methodologies. One such technique, commonly referred to as die inking, aims to discard devices that are likely to fail, based on their prox
Autor:
C. Alleyne, Deepika Neethirajan, Constantinos Xanthopoulos, S. Mier, E. De La Rosa, V. A. Niranjan, Yiorgos Makris
Publikováno v:
VTS
Post-fabrication performance calibration, a.k.a. trimming, is an essential part of analog/RF IC manufacturing and testing. Its objective is to counteract the impact of process variations by individually fine-tuning the performance parameters of every
Autor:
Chee-Wah Ho, Min-Jian Yang, Nidhi Agrawal, Joe Xiao, Vijayakumar Thangamariappan, Keith Schaub, Ira Leventhal, Constantinos Xanthopoulos
Publikováno v:
ITC
The paper will demonstrate the application of Deep Learning (DL) for the detection of defective tester sockets. The proposed methodology relies on images like those used for manual or rule-based inspection, commonly collected using Automated Optical
Continuous technology scaling and the introduction of advanced technology nodes in Integrated Circuit (IC) fabrication is constantly exposing new manufacturability issues. One such issue, stemming from complex interaction between design and process,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::839e2d46e1ec2744702bbef5f5b789f1
Autor:
Ira Leventhal, Deepika Neethirajan, Yiorgos Makris, Keith Schaub, Constantinos Xanthopoulos, Ikeda Kosuke
Publikováno v:
ITC
Automated defect inspection in manufacturing of microscopic probes is an important task and often requires machine learning driven solutions. A supervised only approach can be challenging, because production manufacturing process typically have few d
Autor:
Yiorgos Makris, Arnold Neckermann, Paulus List, Klaus-Peter Tschernay, Peter Sarson, Constantinos Xanthopoulos
Publikováno v:
IOLTS
Ensuring high reliability in modern integrated circuits (ICs) requires the employment of several die screening methodologies. One such technique, commonly referred to as die inking, aims to discard devices that are likely to fail, based on their prox
Autor:
Yiorgos Makris, Kiruba Sankaran Subramani, Keith Schaub, Deepika Neethirajan, Constantinos Xanthopoulos, Ira Leventhal
Publikováno v:
VTS
We propose a machine learning-based solution for noise classification and decomposition in RF transceivers. Wireless transmitters are affected by various noise sources, each of which has a distinct impact on the signal constellation points. The propo
Autor:
Yiorgos Makris, Amit Nahar, Constantinos Xanthopoulos, Sirish Boddikurapati, Deepika Neethirajan
Publikováno v:
DATE
To combat the effects of process variation in modern, high-performance integrated Circuits (ICs), various post-manufacturing calibrations are typically performed. These calibrations aim to bring each device within its specification limits and ensure