Zobrazeno 1 - 10
of 42
pro vyhledávání: '"Constantin Papadas"'
Autor:
Ioannis Katelouzos, Tilemachos Tsiapras, Jacques Monnier, Kostas Makris, Daniel Bretz, Simon Klugseder, Antonios Tavoularis, Gianluca Furano, Tim Helfers, Constantin Papadas, Laurent Hili
The purpose of this communication is to discuss on the suitability of the HPDP device for power-efficient, on-board data processing in future satellites. Five use cases will be presented. These use cases have been analysed in the course of a GSTP de-
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::298b788590dafd7b4c89acf3e01d894e
Autor:
Constantin Papadas, Dimosthenis Fragkopoulos, Panagiotis Vagiannis, Julien Feau, George Dramitinos, Kostas Makris, Didier Bramban
Publikováno v:
Structural Health Monitoring 2017.
The Health Monitoring Smart Sensor (HMSS) is a fully integrated, advanced structural health monitoring platform, currently on test flights monitoring one of the Airbus A380 engines, able to detect and report to the aircraft computer a variety of degr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::98ad40afb9bab55871554151f361e929
https://doi.org/10.12783/shm2017/14207
https://doi.org/10.12783/shm2017/14207
Autor:
Thierry Scholastique, Olga Dokianaki, Stefan Lacan, Constantin Papadas, George Dramitinos, Ingo Saenger, Laurent Hili, Volker Baumgarte, Mohsin Syed, Onoufrios Markakis, Tim Helfers, Michael Kogan
Publikováno v:
AHS
The European Space Agency has initiated the development of the HPDP chip to address the need for a flexible and re-programmable high performance data processor. It is being implemented in the STM 65nm radiation hardened technology. In this paper, the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4cab0bfd3cb276505422d1432f62128a
https://doi.org/10.1109/ahs.2017.8046360
https://doi.org/10.1109/ahs.2017.8046360
Autor:
Wolf Hartmann, Thomas Graule, Markus Wegmann, Constantin Papadas, Thomas Healy, J. Donnelly, Astrid Ullsperger, Alan Mathewson, Frank Clemens
Publikováno v:
Advanced Engineering Materials. 5:682-687
This communication describes a possible path for transition from a wearable computer to a fiber computer in which digital processing power is integrated directly into textiles via circuits on individual fibers. Three different classes of computing fi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ffaf2aa582b18fe58be66869f778f523
https://doi.org/10.1002/adem.200300371
https://doi.org/10.1002/adem.200300371
Autor:
Steve Parkes, A. Antonakou, Paul Rastetter, Tim Helfers, Constantin Papadas, George Dramitinos
Publikováno v:
2014 International SpaceWire Conference (SpaceWire).
Currently Astrium GmbH and Intergrated Systems Development (ISD) S.A. are planning the development of a demonstrator for SpaceFibre. The SpaceFibre demonstrator will be used to execute functional performance tests and EMC (Electro Magnetic Compatibil
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fc804d4fe451fbfe10f826b6aebb196b
https://doi.org/10.1109/spacewire.2014.6936265
https://doi.org/10.1109/spacewire.2014.6936265
Publikováno v:
3DTV-Conference
We describe a series of multi-view and mosaicking cameras we have designed over the past few years for video conferencing, entertainment, sports and special event coverage, light field capture (for display) and ranging applications. These are element
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c4eb75ca0004638642ddbccee0c23b33
https://doi.org/10.1109/3dtv.2014.6874716
https://doi.org/10.1109/3dtv.2014.6874716
Publikováno v:
Microelectronics Reliability. 39:597-613
This paper describes the various methods used for the assessment of the breakdown and wear out properties of thin oxides currently employed in CMOS and EEPROM technologies. Standard procedures for breakdown and wear out testing are given in conjuncti
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a2dcd0de50946ca62be13027d6b39407
https://doi.org/10.1016/s0026-2714(99)00042-6
https://doi.org/10.1016/s0026-2714(99)00042-6
Publikováno v:
Microelectronics Reliability. 37:1499-1506
This paper focuses on the dielectric reliability in the thin and ultrathin oxide regime. The wear-out mechanisms and the breakdown phenomena related to the Si SiO 2 system are considered within the 12nm-5nm oxide thickness range. The degeneration evo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2a45a60cd90966aad2f0dd749a56b81f
https://doi.org/10.1016/s0026-2714(97)00095-4
https://doi.org/10.1016/s0026-2714(97)00095-4
Publikováno v:
Journal of Applied Physics. 82:2548-2557
The practicality of modeling the power law degradation observed in thin dielectrics after Fowler–Nordheim stress has been demonstrated on the basis of a generalized trapping approach with appropriate trap cross-section and density profiles. A detai
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9b8f4a9b70e22580916777e9d2863632
https://doi.org/10.1063/1.366539
https://doi.org/10.1063/1.366539
Publikováno v:
Solid-State Electronics. 41:1001-1004
The trapping properties of thin oxide layers during Fowler-Nordheim electron injection have been investigated as a function of temperature in the range 258–423 K. It is found that the bulk oxide trapped charge at breakdown is almost temperature ind
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e2c452857c43e81a8081ab6f7a5b2724
https://doi.org/10.1016/s0038-1101(97)00013-0
https://doi.org/10.1016/s0038-1101(97)00013-0