Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Conrad Bugeja"'
Autor:
Riccardo Cantoro, Conrad Bugeja, Federico Venini, Giorgio Pollaccia, D. Appello, M. Restifo, Paolo Bernardi
Publikováno v:
Journal of Electronic Testing. 34:43-52
The cost of Burn-In is a major concern for the testing of Automotive Systems-on-Chip (SoC). This paper highlights problematic aspects of a Burn-In flow and describes a two-layered adaptive technique that permits to optimize the stress application and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::32113092e24b4b04ebea90b88fd67b7a
https://doi.org/10.1007/s10836-018-5705-1
https://doi.org/10.1007/s10836-018-5705-1
Autor:
Paolo Bernardi, D. Appello, Ernesto Sánchez, Conrad Bugeja, Giorgio Pollaccia, Federico Venini, Riccardo Cantoro, Andrea Colazzo, Alberto Pagani, Alessandro Motta, M. Restifo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9afd2939d7097f6e835ccab8ba2cd924
http://hdl.handle.net/11583/2698575
http://hdl.handle.net/11583/2698575
Autor:
Ernesto Sanchez, M. Restifo, Conrad Bugeja, Giorgio Pollaccia, Paolo Bernardi, D. Appello, Federico Venini, Riccardo Cantoro
Early life failures have to be excluded to fulfill the high reliability needs of automotive electronics. While burn-in test may be an effective technique, it is also a very significant cost factor. This article presents strategies for stress test par
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9f71f047d9cceb0a5cb969a023743a20
http://hdl.handle.net/11583/2698573
http://hdl.handle.net/11583/2698573