Zobrazeno 1 - 10
of 11
pro vyhledávání: '"Congbing Li"'
Publikováno v:
ASICON
We describe a signal high-frequency estimation circuit using multiple low-frequency sampling circuits following an analog Hilbert filter and analog-to-digital converters (ADCs); here the sampling frequencies are relatively prime. Our proposed system
Publikováno v:
IEEJ Transactions on Electronics, Information and Systems. 137:335-341
Autor:
Haruo Kobayashi, Congbing Li
Publikováno v:
IEEJ Transactions on Electronics, Information and Systems. 136:22-27
Publikováno v:
2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW).
This paper presents a time-to-digital converter (TDC) architecture to measure the timing difference between single-event two pulses with fine time resolution. Its features are as follows: (i) The architecture is based on stochastic process and statis
Autor:
Congbing Li, Haruo Kobayashi, Richen Jiang, Mayu Hirano, Kazumi Hatayama, Yuki Ozawa, Nobukazu Tsukiji, Mingcong Yang, Ryoji Shiota
Publikováno v:
2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW).
This paper presents a time-to-digital converter (TDC) architecture with reduced hardware suitable for multichannel timing built-out self-test (BOST) implementation on an FPGA chip. In order to reduce the number of buffers and DFFs in a conventional F
Autor:
Congbing Li, Haruo Kobayashi
Publikováno v:
2015 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT).
A glitch-free time-to-digital converter (TDC) based on Gray code is presented. This architecture can reduce hardware, power consumption, as well as chip area significantly compared to a flash type TDC, while keeping comparable performance and glitch-
Publikováno v:
2014 International SoC Design Conference (ISOCC).
This paper describes a time-to-digital converter (TDC) architecuture with residue arithmetic or Chinese Remainder theorem. It can reduce the hardware and power significantly compared to a flash type TDC while keeping comparable performance. Its FPGA
Autor:
Sato Koshi, Yutaro Kobayashi, Kentaroh Katoh, Takeshi Chujo, Junshan Wang, Congbing Li, Haruo Kobayashi, Daiki Hirabayashi
Publikováno v:
19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings.
This paper describes the architecture, implementation and measurement results for a Time-to-Digital Converter (TDC), with histogram-method self-calibration, for high-speed I/O interface circuit test applications. We have implemented the proposed TDC
Autor:
Congbing Li, Kentaroh Katoh, Ensi Li, Takeshi Chujo, Yutaro Kobayashi, Junshan Wang, Haruo Kobayashi
Publikováno v:
Journal of Electronic Testing. 31:419-419
Publikováno v:
IEICE Electronics Express. 11:20142001-20142001