Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Cong-yuan Xu"'
Publikováno v:
Frontiers of Information Technology & Electronic Engineering. 18:1654-1664
Compared with complementary metal–oxide semiconductor (CMOS), the resonant tunneling device (RTD) has better performances; it is the most promising candidate for next-generation integrated circuit devices. The universal logic gate is an important u
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e3d9c9b1af2d082123605676e0f64152
https://doi.org/10.1631/fitee.1601730
https://doi.org/10.1631/fitee.1601730
Publikováno v:
Frontiers of Information Technology & Electronic Engineering. 17:962-972
A novel dual-edge implicit pulse-triggered flip-flop with an embedded clock-gating scheme (DIFF-CGS) is proposed, which employs a transmission-gate-logic (TGL) based clock-gating scheme in the pulse generation stage. This scheme condi- tionally disab
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::dc722018d21e887a0efbef6e4db4c120
https://doi.org/10.1631/fitee.1500293
https://doi.org/10.1631/fitee.1500293
Publikováno v:
Frontiers of Information Technology & Electronic Engineering. 16:694-699
Traditional CMOS technology faces some fundamental physical limitations. Therefore, it has become very important for the integrated circuit industry to continue to develop modern devices and new design methods. The threshold logic gate has attracted
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3746c4304629176bb766c665a350d9a5
https://doi.org/10.1631/fitee.1500102
https://doi.org/10.1631/fitee.1500102
Publikováno v:
Journal of Applied Mathematics, Vol 2015 (2015)
J. Appl. Math.
J. Appl. Math.
The resonant tunneling device (RTD) has attracted much attention because of its unique negative differential resistance characteristic and its functional versatility and is more suitable for implementing the threshold logic gate. The universal logic
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::61f50524dc9c69b414b80712a534e0e8
https://doaj.org/article/48a721d744424e1db6f043cb1c1c7a45
https://doaj.org/article/48a721d744424e1db6f043cb1c1c7a45