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Efficiency evaluation of analog/RF alternate test: Comparative study of indirect measurement selection strategies

Autor: Larguech, Syhem, Azaïs, Florence, Bernard, Serge, Comte, Mariane, Kerzérho, Vincent, Renovell, Michel

Publikováno v: In Microelectronics Journal November 2015 46(11):1091-1102

Indirect test of RF circuits using ensemble methods

Autor: El Badawi, Hassan, Azaïs, Florence, Bernard, Serge, Comte, Mariane, Kerzérho, Vincent, Lefèvre, François

Publikováno v: European Test Symposium (ETS)
European Test Symposium (ETS), May 2020, Tallinn, Estonia
ETS 2020-IEEE European Test Symposium
ETS 2020-IEEE European Test Symposium, May 2020, Tallinn, Estonia

International audience; The adoption of indirect test for analog and RF integrated circuits (ICs) can tackle the rising costs of the classical industrial testing of these circuits, hence relaxing the requirements on test equipment. Based on machine-l

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::dadb2cd1cdf486031ce69f607d0333a1
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03001530/document

The Use of Ensemble Learning in Indirect Testing of Analog and RF Integrated Circuits

Autor: El Badawi, Hassan, Azaïs, Florence, Bernard, Serge, Comte, Mariane, Kerzérho, Vincent, Lefèvre, François

Publikováno v: South European Test Seminar (SETS)
South European Test Seminar (SETS), 2019, Pitztal, Austria

International audience

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::b16ca3adaba003e012dd89f7573f3a97
https://hal-lirmm.ccsd.cnrs.fr/lirmm-02375866

Detection of resistive open and short defects in FDSOI under delay-based test: Optimal VDD and body biasing conditions

Autor: Karel, Amit, Azaïs, Florence, Comte, Mariane, Galliere, Jean-Marc, Renovell, Michel, Singh, Keshav

Publikováno v: 22nd European Test Symposium
ETS: European Test Symposium
ETS: European Test Symposium, May 2017, Limassol, Cyprus. ⟨10.1109/ETS.2017.7968208⟩

International audience; This paper presents a comprehensive study towards the identification and quantification of the detectability improvement of resistive open and short defects, brought by specific supply voltage and body biasing conditions appli

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::a7a24c9d33f195290cf0f4131ccb4799
https://hal.archives-ouvertes.fr/hal-01709615