Zobrazeno 1 - 10
of 10
pro vyhledávání: '"Colin G. McKay"'
Autor:
Fedor V. Sharov, Stephen J. Moxim, Gaddi S. Haase, David R. Hughart, Colin G. McKay, Patrick M. Lenahan
Publikováno v:
IEEE Transactions on Device and Materials Reliability. 22:322-331
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c022885334840fa195d4d82dd4ca3d9d
https://doi.org/10.1109/tdmr.2022.3186232
https://doi.org/10.1109/tdmr.2022.3186232
Autor:
Stephen J. Moxim, Fedor V. Sharov, David R. Hughart, Gaddi S. Haase, Colin G. McKay, Elias B. Frantz, Patrick M. Lenhan
Publikováno v:
The Review of scientific instruments. 93(11)
We demonstrate the ability of a relatively new analytical technique, near-zero-field magnetoresistance (NZFMR), to track atomic-scale phenomena involved in the high-field stressing damage of fully processed Si metal-oxide-semiconductor field-effect t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::21a7d2a79bd446490db26794cc14ec02
https://pubmed.ncbi.nlm.nih.gov/36461532
https://pubmed.ncbi.nlm.nih.gov/36461532
Autor:
Fedor V. Sharov, Stephen. J. Moxim, Patrick M. Lenahan, David R. Hughart, Gaddi S. Haase, Colin. G. McKay
Publikováno v:
2021 IEEE International Integrated Reliability Workshop (IIRW).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c39b2283dbe15a2fd1b0a2c84c4f55d7
https://doi.org/10.1109/iirw53245.2021.9635607
https://doi.org/10.1109/iirw53245.2021.9635607
Autor:
Ryan J. Waskiewicz, Chadwin D. Young, Patrick M. Lenahan, Nicholas J. Harmon, James P. Ashton, Colin G. Mckay, Kenneth J. Myers, Michael E. Flatté, Stephen J. Moxim
Publikováno v:
IEEE Transactions on Nuclear Science. 66:428-436
We demonstrate that a new technique, near-zero field magnetoresistance (NZFMR) spectroscopy, can explore radiation damage in a wide variety of devices in a proof-of-concept study. The technique has great potential for the study of atomic-scale mechan
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9c5fa531fef9be19490ddd2d7bcb3d11
https://doi.org/10.1109/tns.2018.2885300
https://doi.org/10.1109/tns.2018.2885300
Autor:
Stephen J. Moxim, Fedor V. Sharov, David R. Hughart, Gaddi S. Haase, Colin G. McKay, Patrick M. Lenahan
Publikováno v:
Applied Physics Letters. 120:063502
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c2cd07e0cd8583405d47ff7833199a9a
https://doi.org/10.1063/5.0077946
https://doi.org/10.1063/5.0077946
Publikováno v:
Journal of Applied Physics; 10/14/2019, Vol. 126 Issue 14, p1-7, 7p, 1 Diagram, 1 Chart, 7 Graphs
Autor:
Moxim, Stephen J., Sharov, Fedor V., Hughart, David R., Haase, Gaddi S., McKay, Colin G., Frantz, Elias B., Lenhan, Patrick M.
Publikováno v:
Review of Scientific Instruments; 11/1/2022, Vol. 93 Issue 11, p1-7, 7p
Autor:
Sharov, Fedor V., Moxim, Stephen J., Haase, Gaddi S., Hughart, David R., McKay, Colin G., Lenahan, Patrick M.
Publikováno v:
IEEE Transactions on Device & Materials Reliability; Sep2022, Vol. 22 Issue 3, p322-331, 10p
Autor:
Moxim, Stephen J., Sharov, Fedor V., Hughart, David R., Haase, Gaddi S., McKay, Colin G., Lenahan, Patrick M.
Publikováno v:
Applied Physics Letters; 2/7/2022, Vol. 120 Issue 6, p1-6, 6p
Autor:
Ashton, James P., Moxim, Stephen J., Lenahan, Patrick M., Mckay, Colin G., Waskiewicz, Ryan J., Myers, Kenneth J., Flatte, Michael E., Harmon, Nicholas J., Young, Chadwin D.
Publikováno v:
IEEE Transactions on Nuclear Science; Jan2019, Vol. 66 Issue 1, p428-436, 9p