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pro vyhledávání: '"Colchero, J"'
Atomic force microscopy is based on tip sample interaction, which is determined by the properties of tip and sample. Unfortunately, in particular in ambient conditions the tip as well as the sample are contaminated, and it is not clear how this conta
Externí odkaz:
http://arxiv.org/abs/1712.06052
Autor:
Orihuela, M. F., Ortuno, M., Somoza, A. M., Colchero, J., Palacios-Lidón, E., Grenet, T., Delahaye, J.
We have used the Scanning Kelvin probe microscopy technique to monitor the charging process of highly resistive granular thin films. The sample is connected to two leads and is separated by an insulator layer from a gate electrode. When a gate voltag
Externí odkaz:
http://arxiv.org/abs/1705.01771
Autor:
Colchero, J., Cuenca, M., Martinez, J. F. Gonzalez, Abad, J., Palacios-Lidon, E., Abellan, J.
Thermal fluctuation of the cantilever position sets a fundamental limit for the precision of any Scanning Force Microscope. In the present work we analyse how these fluctuations limit the determination of the resonance frequency of the tip-sample sys
Externí odkaz:
http://arxiv.org/abs/1002.4284
Autor:
Gómez-Navarro, C., Moreno-Herrero, F., de Pablo, P. J., Colchero, J., Gómez-Herrero, J., Baró, A. M.
Publikováno v:
Proceedings of the National Academy of Sciences of the United States of America, 2002 Jun . 99(13), 8484-8487.
Externí odkaz:
https://www.jstor.org/stable/3059042
Akademický článek
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Autor:
Orihuela, M.F. a, ⁎, Abad, J. b, c, González Martínez, J.F. c, Fernández, F.J. a, Colchero, J. c
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