Lossless photon flux sensing methodology for EUV and Soft X-ray metrology systems

Autor: Weerdenburg, Sven, Horsten, Roland, Coene, Wim

We demonstrate a simple, lossless method for monitoring photon flux in short-wavelength metrology systems, with a particular focus on applications using high harmonic generation (HHG) light sources. In HHG-based metrology, where photon scarcity often

Externí odkaz: http://arxiv.org/abs/2410.20479

Impact of temperature and water source on drinking water microbiome during distribution in a pilot-scale study

Autor: Fien Waegenaar, Thomas Pluym, Laura Coene, Jozefien Schelfhout, Cristina García-Timermans, Bart De Gusseme, Nico Boon

Publikováno v: npj Clean Water, Vol 7, Iss 1, Pp 1-10 (2024)

Abstract This study utilized a pilot-scale distribution network to examine the impact of temperature increases (16 °C, 20 °C, 24 °C) and source variations (treated ground- and surface water) on bulk and biofilm communities over 137 days. Microbial

Externí odkaz: https://doaj.org/article/821add0fcd964920adce3c56fa8957f0

Incidence of arthroscopic and open pediatric shoulder stabilization procedures across the United States: a Pediatric Health Information System database study

Autor: Angela M. Mercurio, MD, Ryan P. Coene, MS, Danielle L. Cook, MA, Lanna Feldman, MS, Matthew D. Milewski, MD

Publikováno v: JSES Reviews, Reports, and Techniques, Vol 4, Iss 3, Pp 406-412 (2024)

Background: Shoulder instability in pediatric and adolescent patients can be treated operatively via arthroscopic or open procedures, but there a paucity of evidence to support the incidence of these treatment modalities over time. It is hypothesized

Externí odkaz: https://doaj.org/article/2ec8bd140ffe465a92cfac9a17c7df92

High PEEP/low FiO2 ventilation is associated with lower mortality in COVID–19

Autor: Ahuja, S., van Akkeren, J.P., Algera, A.G., Algoe, C.K., van Amstel, R.B., Artigas, A., Aydeniz, E., Bailey, M., van den Berg, A.E., van de Berg, P., Bergmans, D.C.J.J., van den Bersselaar, D.I., Bertens, F.A., Bevers, M., Bindels, A.J.G.H., Breel, J.S., de Bruin, S., Bruna, C.L., de Boer, M., Boer, D.P., den Boer, S., Boers, L.S., Bogerd, M.B., Bos, L.D., Bosman, B., Botta, M., de Bie, A.J.R., Baur, O.L., Buiteman-Kruizinga, L.A., Coene, W., Cremer, O.L., Daenen, K., Delmte, M., Determann, R.M., Dieperink, W., Di Leo, V., van Dijk, J., Dongelmans, D.A., Dormans, T., Endeman, H., Elting, L.M., Esmeijer, A.A., Filippini, D., Flim, J.M., Franke, H.S., Galek-aldridge, M.S., de Abreu, M.G. Gama, Girbes, A.R., Go, D.M., Goossen, R.L., de Graaff, M.J., Hagens, L.A., Hansen, H.J., Haringman, J.J., van der Heide, S.T., van der Heiden, P.L.J., Heijnen, N.F.L., Hiel, S.J.P., Hoeijmakers, L.L., Hol, L., Hollmann, M.W., Hoogendoorn, M.E., Horn, J., van der Horst, I., van der Horst, R., Huijben, J.A., Ie, E.L.K., van Ingen, L.E., Ivanov, D.P., Juffermans, N.P., Kranen, H.T., Kho, E., de Klerk, E.S., Koek, N., Gemert, A.W.M.M. Koopman-van, Koopmans, M., Kucukcelebi, S., Kuiper, M.A., Kuipers, L.J., Koornstra, E., Lokhorst, A., de Lange, D.W., Martin-Loeches, I., van Meenen, D.M.P., Mazzinari, G., Moeniralam, H., van Mourik, N., Myatra, S.N., Nijbroek, S.G., van Oosten, P., Offermans, M., Onrust, M., Oostdijk, E.A.N., Paulus, F., Pennartz, C.J., Peršec, J., Peters, V.J.T., Pillay, J.J., Pisani, L., Pisters, T., Prins, A., Purmer, I.M., Rettig, T.C.D., Rezaee, A.S., Roca, O., Roozeman, J., Rozendaal, J., Rosenberg, N.M., Schavemaker, R., Sciascera, A., Schuijt, M.T.U., Schultz, M.J., Neto, A.S. Serpa, Shrestha, G.S., van Silfhout, B., Sjoding, M., Sleeswijk, M.E., van Smaalen, K.M., Smit, M.R., Spronk, P.E., Šribar, A., Strang, A.C., Stilma, W., Swart, P., Tuinman, P.R., Tsonas, A.M., den Uil, C.A., Valk, C.M.A., Veen-Schra, F.L., Vlaar, A.P.J., Veldhuis, L.I., van der Ven, W.H., van der Ven, F.L.I.M., van Velzen, P., Verboom, M., Verhoef, E.J., Vermeulen, T.D., van Vliet, P., van Vliet, R., Voorham, J.S., van der Voort, P.H.J., van Welie, L., Weller, D., Wentink, A.R., Wesselink, H.J.F.T., van der Wier-Lubbers, H., van Wijk, B., van Willigen, H., van der Woude, M.C.E., Weiner, J.J., Winters, T., Wong, W.Y., Yaali, N., Zandvliet, J.M., van Zanten, A.R.H., van Zijl, T.Z.I., Zonneveld, S.A., Goossen, Robin L., van Vliet, Relin, Bos, Lieuwe D.J., Buiteman-Kruizinga, Laura A., Hollman, Markus W., Myatra, Sheila N., Neto, Ary Serpa, Spronk, Peter E., van der Woude, Meta C.E., van Meenen, David M.P., Paulus, Frederique, Schultz, Marcus J.

Publikováno v: In Journal of Critical Care October 2024 83

Non-isoplanatic lens aberration correction in dark-field digital holographic microscopy for semiconductor metrology

Autor: Tamar van Gardingen-Cromwijk, Sander Konijnenberg, Wim Coene, Manashee Adhikary, Teus Tukker, Stefan Witte, Johannes F. de Boer, Arie den Boef

Publikováno v: Light: Advanced Manufacturing, Vol 4, Iss 4, Pp 453-465 (2024)

In the semiconductor industry, the demand for more precise and accurate overlay metrology tools has increased because of the continued shrinking of feature sizes in integrated circuits. To achieve the required sub-nanometre precision, the current tec

Externí odkaz: https://doaj.org/article/7e2b9089b27342a49dfd7bd5699750c0