Zobrazeno 1 - 10
of 41
pro vyhledávání: '"Civale, Yann"'
Autor:
Inoue, Fumihiro, Philipsen, Harold, Radisic, Aleksandar, Armini, Silvia, Civale, Yann, Leunissen, Peter, Kondo, Muneharu, Webb, Eric, Shingubara, Shoso
Publikováno v:
In Electrochimica Acta 30 June 2013 100:203-211
Autor:
Civale, Yann, Croes, Kristof, Miyamori, Yuichi, Velenis, Dimitrios, Redolfi, Augusto, Thangaraju, Sarasvathi, Ammel, Annemie Van, Cherman, Vladimir, Plas, Geert Van der, Cockburn, Andrew, Gravey, Virginie, Kumar, Nirajan, Cao, Zhitao, Travaly, Youssef, Tőkei, Zsolt, Beyne, Eric, Swinnen, Bart
Publikováno v:
In Microelectronic Engineering June 2013 106:155-159
Publikováno v:
In Solid State Electronics 2010 54(9):870-876
Silicon-on-insulator (SOI) regions have been grown on lithographically predetermined positions by Al- mediated Solid-Phase Epitaxy (SPE) of amorphous silicon (α-Si). A controllable Si lateral overgrowth is induced from windows formed in silicon diox
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=57a035e5b1ae::cdd2342a006598f85be74001ba47eea1
https://www.bib.irb.hr/492323
https://www.bib.irb.hr/492323
Autor:
Civale, Yann, Van Huylenbroeck, Stefaan, Redolfi, Augusto, Guo, Wei, Gavan, Khashayar Babaei, Jaenen, Patrick, Manna, Antonio La, Beyer, Gerald, Swinnen, Bart, Beyne, Eric
Publikováno v:
2013 IEEE 63rd Electronic Components & Technology Conference; 2013, p1420-1424, 5p
Autor:
Phommahaxay, Alain, De Wolf, Ingrid, Hoffrogge, Peter, Brand, Sebastian, Czurratis, Peter, Philipsen, Harold, Civale, Yann, Vandersmissen, Kevin, Halder, Sandip, Beyer, Gerald, Swinnen, Bart, Miller, Andy, Beyne, Eric
Publikováno v:
2013 IEEE 63rd Electronic Components & Technology Conference; 2013, p227-231, 5p
Autor:
Burggraf, Jurgen, Wiesbauer, Harald, Bravin, Julian, Uhrmann, Thomas, Meynen, Herman, Civale, Yann, John, Ranjith, Wang, Sheng, Fu, Peng-Fei, Yeakle, Craig
Publikováno v:
2013 IEEE 15th Electronics Packaging Technology Conference (EPTC 2013); 2013, p62-66, 5p
Autor:
Civale, Yann, Meynen, Herman, John, Ranjith S. E., Fu, Peng-Fei, Yeakle, Craig R., Wang, Sheng, Krausse, Stefan, Rapps, Thomas, Lutter, Stefan
Publikováno v:
2013 IEEE International 3D Systems Integration Conference (3DIC); 2013, p1-5, 5p
Autor:
Croes, Kristof, Cherman, Vladimir O., Li, Yunlong, Zhao, Larry, Barbarin, Yohan, De Messemaeker, Joke, Civale, Yann, Velenis, Dimitrios, Stucchi, Michele, Kauerauf, Thomas, Redolfi, Augusto, Dimcic, Biljana, Ivankovic, Andrej, Van der Plas, Geert, De Wolf, Ingrid, Beyer, Gerald, Swinnen, Bart, Tokei, Zsolt, Beyne, Eric
Publikováno v:
2012 19th IEEE International Symposium on the Physical & Failure Analysis of Integrated Circuits; 1/ 1/2012, p1-5, 5p
Autor:
Civale, Yann, Redolfi, Augusto, Jaenen, Patrick, Kostermans, Maarten, Van Besien, Els, Mertens, Sofie, Witters, Thomas, Jourdan, Nicolas, Armini, Silvia, El-Mekki, Zaid, Vandersmissen, Kevin, Philipsen, Harold, Verdonck, Patrick, Heylen, Nancy, Nolmans, Philip, Yunlong Li, Croes, Kristof, Beyer, Gerald, Swinnen, Bart, Beyne, Eric
Publikováno v:
2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT); 2012, p1-5, 5p