Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Ciprian V. Pop"'
Autor:
Marius Vasilescu, Tudor-Mihai Butte, Ana-Iulia Biță, Aurora Antoniac, Marian Miculescu, Aura-Cătălina Mocanu, Octavian Trante, Ciprian V. Pop, L. T. Ciocan, Claudia-Georgiana Milea, Robert-Cătălin Ciocoiu
Publikováno v:
Studia Universitatis Babeș-Bolyai Chemia. 65:73-84
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4e8d03a16c831cba361d59a10087b322
https://doi.org/10.24193/subbchem.2020.4.06
https://doi.org/10.24193/subbchem.2020.4.06
Publikováno v:
IEEE Transactions on Device and Materials Reliability. 19:654-663
The paper proposes a methodology for estimation of the variation of power devices lifetime using data from different stages of development and tests. In the characterization process of power devices, the estimation of the minimum lifetime is not a si
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::eb542f96f9232fa8b05baefa854f405b
https://doi.org/10.1109/tdmr.2019.2940672
https://doi.org/10.1109/tdmr.2019.2940672
Publikováno v:
2020 International Symposium on Electronics and Telecommunications (ISETC)
The yield is considered a key performance measure in determining the success of semiconductor manufacturing. As the inherent process variation affects the yield and causes redesign, quick and accurate methods are needed for yield analysis and failure
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::374c9eac63780d6050ae3f726e8b09bf
https://doi.org/10.1109/isetc50328.2020.9301121
https://doi.org/10.1109/isetc50328.2020.9301121
Publikováno v:
2019 International Semiconductor Conference (CAS).
The active cycling (repetitive clamping) of power devices is a time consuming process. For this reason, a limited amount of reliability data is available and the manufacturers most often provide the lifetime parameters only for a few specific operati
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a7950d72d4f1a44b8c8f81a3938022a2
https://doi.org/10.1109/smicnd.2019.8923773
https://doi.org/10.1109/smicnd.2019.8923773
Publikováno v:
ETS
This paper proposes a method for explanation of the lifetime variation of power devices using data from different test stages. Understanding the lifetime variation is very useful in qualification, as well as in the characterization process, in order
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::718af0c9791308aee7d10d4c9da0d526
https://doi.org/10.1109/ets.2018.8400710
https://doi.org/10.1109/ets.2018.8400710
Publikováno v:
ETS
The paper proposes a methodology for lifetime estimation of power devices at given applications operating conditions. The active cycling of power devices requires huge testing-time, because the process cannot be accelerated. For this reason, most oft
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4caea1730008cffa33a1fadb798f585e
https://doi.org/10.1109/ets.2017.7968242
https://doi.org/10.1109/ets.2017.7968242