Zobrazeno 1 - 10
of 705
pro vyhledávání: '"Ci -Ling Pan"'
Autor:
F. -M. Kuo, C. -B. Huang, J. -W. Shi, Nan -Wei Chen, H. -P. Chuang, John E. Bowers, Ci -Ling Pan
Publikováno v:
IEEE Photonics Journal, Vol 3, Iss 2, Pp 209-219 (2011)
We demonstrate a remotely up-converted and distributed 20-Gbit/s wireless on-off-keying (OOK) data transmission link at the W-band that uses a near-ballistic uni-traveling-carrier photodiode (NBUTC-PD)-based photonic transmitter-mixer. This device co
Externí odkaz:
https://doaj.org/article/2c9c418a77c5413e96726ad8f7268c5b
Publikováno v:
AIP Advances, Vol 10, Iss 5, Pp 055321-055321-9 (2020)
Near ultraviolet (λ ≈ 400 nm) femtosecond laser annealing (400 nm-FLA) in a scanning mode was employed to crystallize amorphous silicon (a-Si) films at room temperature. The average grain size of polycrystalline silicon annealed was studied as a f
Externí odkaz:
https://doaj.org/article/874c12aa09614add8eb233343144bea3
Autor:
Chengming Wang, Yi-Jing You, Shengnan Ai, Wenxin Zhang, Wenchao Liao, Xiao Zhang, Juicheng Hsieh, Ning Zhang, Bihua Tang, Ci-Ling Pan, Ping Xue
Publikováno v:
Journal of Innovative Optical Health Sciences, Vol 12, Iss 2, Pp 1950009-1-1950009-7 (2019)
In most coherent imaging modality, speckle noise is a major cause that blurs the boundary of tissues and degrades the image contrast. By utilizing the unique properties of supercontinuum (SC) generated by noise-like pulses (NLPs) and a simple multi-f
Externí odkaz:
https://doaj.org/article/26f446bbb90f4b7ca6f3e9f2357a496e
High-dielectric constant glasses are prerequisite for developing terahertz (THz) components and systems. Oxyfluorosilicate (OFS) glasses have been developed and their THz properties have been characterized by using THz-time domain spectroscopy (THz-T
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7795a82f4d2191e753cbae0e2840ebd5
https://mts.intechopen.com/articles/show/title/systematic-characterization-of-high-dielectric-constant-glass-materials-using-thz-tds-technique
https://mts.intechopen.com/articles/show/title/systematic-characterization-of-high-dielectric-constant-glass-materials-using-thz-tds-technique
Publikováno v:
Coatings
Volume 13
Issue 2
Pages: 461
Volume 13
Issue 2
Pages: 461
In this study, we report enhancement of terahertz (THz) radiation with indium-tin-oxide (ITO) thin-film deposited on semi-insulating gallium arsenide substrate (SI-GaAs). The amplitude of THz emission from both ITO/SI-GaAs and bare SI-GaAs substrate
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4c5a88be1d2ff4580cf5d0d510600368
Autor:
Anup Kumar Sahoo, Chan-Shan Yang, Chun-Ling Yen, Hung-Chun Lin, Yu-Jen Wang, Yi-Hsin Lin, Osamu Wada, Ci-Ling Pan
Publikováno v:
Applied Sciences, Vol 9, Iss 4, p 761 (2019)
For this study, we demonstrated three different types of twisted nematic (TN) liquid crystal (LC) terahertz (THz) phase shifters using pristine poly(3,4-ethylenedioxythiophene):poly(styrenesulfonate) (PEDOT: PSS) thin films as transparent conducting
Externí odkaz:
https://doaj.org/article/0f8a297685d9455e8babbd8574ae9c75
Publikováno v:
Journal of Physics and Chemistry of Solids. 176:111237
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::798f207f99b08f0b62a71321c74f8b27
https://doi.org/10.1016/j.jpcs.2023.111237
https://doi.org/10.1016/j.jpcs.2023.111237
Publikováno v:
Optical Materials Express. 11(3):858-874
A terahertz (THz) dielectric property characterization method based on a unified single oscillator model has been developed and applied to a variety of multi-component silicate oxide glasses. The experimental values of dielectric constant determined
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::eab4b6ffbf4fbe8bc4f362c4472918f7
http://www.lib.kobe-u.ac.jp/handle_kernel/90009496
http://www.lib.kobe-u.ac.jp/handle_kernel/90009496
Publikováno v:
Optical Materials Express. 10(2):607-621
Dielectric properties of oxyfluorosilicate (OFS) glasses have been characterized using Terahertz (THz)-time domain spectroscopy in the sub-THz region as well as optical reflection measurement. OFS glass containing 20 mol% of Nb2O5, which is termed ZN
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5be9300da2a84b6dd31c756b88a15e70
https://hdl.handle.net/20.500.14094/90008125
https://hdl.handle.net/20.500.14094/90008125
Autor:
Anup Kumar Sahoo, Wei-Chen Au, Yu-Cheng Hong, Ci-Ling Pan, Dongwei Zhai, Emilie Hérault, Frédéric Garet, Jean-Louis Coutaz
Publikováno v:
Journal of Applied Physics. 133:125705
We investigate terahertz time-domain spectroscopy (THz-TDS) as a non-destructive and non-contact technique for depth profiling of dopants in semiconductors. THz temporal waveforms transmitted through silicon-ion-implanted semi-insulating gallium arse
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a602c131d704bbdb2bf285a6539e9930
https://doi.org/10.1063/5.0138345
https://doi.org/10.1063/5.0138345