Zobrazeno 1 - 10
of 12
pro vyhledávání: '"Chutchai Pawong"'
Autor:
Abdullahi Usman, Apichai Bhatranand, Yuttapong Jiraraksopakun, Rapeepan Kaewon, Chutchai Pawong
Publikováno v:
Photonics, Vol 8, Iss 12, p 529 (2021)
This paper describes a modified Sagnac interferometer with a self-referenced polarization and phase-shifting technique for real-time thickness measurement of single- and double-layer transparent thin films. The proposed interferometric setup generate
Externí odkaz:
https://doaj.org/article/6b4e850ba6b94df69e4ba192b1952a22
Autor:
Abdullahi Usman, Apichai Bhatranand, Yuttapong Jiraraksopakun, Rapeepan Kaewon, Chutchai Pawong
Publikováno v:
2022 International Electrical Engineering Congress (iEECON).
Autor:
Chutima Oopathump, Chutima Paksunchai, Chirawat Chantharangsi, Chutchai Pawong, Poemyot Wongbua-ngam
Publikováno v:
Current Applied Science and Technology. 22
In this study, a green electrode made from natural fiber paper was investigated. A pineapple fiber paper was used as electrode support material. A mixture of multiwalled carbon nanotubes and PEDOT: PSS (MWCNTs/ PEDOT: PSS) was used as active electrod
Autor:
Abdullahi Usman, Yuttapong Jiraraksopakun, Rapeepan Kaewon, Chutchai Pawong, Apichai Bhatranand
Publikováno v:
Laser Physics. 32:125401
This paper presents the comparison of three-, four- and five-step techniques for measuring transparent thin-film thickness of T a 2 O 5 and W O 3 deposited on BK-7 substrates. The Sagnac interferometer was modified with phase shifting approach for th
Autor:
Apichai Bhatranand, Tossaporn Lertvanithphol, Ratchapak Chitaree, Rapeepan Kaewon, Chutchai Pawong
Publikováno v:
Optica Applicata. 50
An alternative polarization phase-shifting technique is proposed to determine the thickness of transparent thin-films. In this study, the cyclic interferometric configuration is chosen to maintain the stability of the operation against external vibra
Publikováno v:
Applied Mechanics and Materials. 804:47-50
The effects of cobalt, nickel and iron catalyst on carbon nanotubes (CNTs) were examined with scanning electron microscope (SEM), transmission electron microscope (TEM), X-ray diffractrometer (XRD) and Fourier transform Raman spectrometer (FT-Raman).
Publikováno v:
2016 15th International Conference on Optical Communications and Networks (ICOCN).
The purpose of this study aims to investigate a new method for measuring the phase retardation caused by the induced birefringence from a liquid crystal sample. The method uses a polarizing triangular interferometer whose arrangement requires just a
Publikováno v:
Optics & Laser Technology. 43:461-468
The production and control of a required polarization state are very important in optical measurements such as thin film surface characterization, ensuring continuity of data measurement and speedy acquisition. In this paper, a polarizing Mach–Zehn
Publikováno v:
SPIE Proceedings.
This paper presents the polarizing triangular cyclic interferometer (pTCi) for characterizing optical samples with birefringent properties such as half- and quarter-wave plates. The interferometric system was set up to analyze the phase retardation o
Publikováno v:
Asia Communications and Photonics Conference 2014.
The application of the polarizing triangular cyclic interferometer to distinguish different types of polarizing components is investigated. The distinct output signals from polarizer and wave plates under examination can clearly be observed.