Zobrazeno 1 - 10
of 37
pro vyhledávání: '"Chunshui Jin"'
Publikováno v:
Journal of Optics. 25:015701
A mapping model of arbitrarily shaped surfaces and the system image quality is constructed to examine the optimization of the residual aberration of an off-axis optical system to construct an off-axis optical system with very small aberrations. First
Publikováno v:
Optics Communications. 433:52-59
We present a method for designing error-resistant phase-shifting algorithms to suppress error sources in phase-shifting interferometry. Firstly, the partial-differential processing is applied to the weighted least squares algorithm to obtain error se
Publikováno v:
Applied optics. 59(32)
This paper proposes a grouping design method based on a combination of spatial ray tracing and aberration correction to construct the initial structure for an off-axis multi-reflective aspheric optical system. This method establishes a mathematical p
Publikováno v:
Applied Optics. 60:4557
This paper proposes a design method for an off-axis reflective anamorphic optical system (ORAOS). This method first applies vector aberration theory to establish a mathematical model to balance the aberration of an ORAOS. It then builds the error fun
Publikováno v:
Surface and Coatings Technology. 395:125691
HfO2 films were fabricated by plasma-ion-assisted deposition of electron beam evaporation (PIAD-EBE) for low absorption applications in UV. The optical, structural and composition properties of the deposited HfO2 films were systematically investigate
Publikováno v:
Optics Express. 28:13516
We performed experiments involving the fabrication of Mo/Si multilayer coatings and established a model of the deposition process. The surface and interface roughness, surface power spectral density, layer structures, and coating reflectivity were ch
Publikováno v:
Chinese Journal of Engineering Science. 22:29
Publikováno v:
Optical Engineering. 58:1
Extreme ultraviolet lithography (EUVL) is recognized as a leading technology in next-generation lithography. Achieving spectral purification while ensuring extreme ultraviolet (EUV) reflectance is one of the key technologies for industrializing EUVL.
Publikováno v:
SPIE Proceedings.
To meet the requirements of wavelength matching and figure preservation for EUV multilayer optics, study of precise control of the lateral thickness gradients of multilayer was performed. The distribution of the magnetron sputtering source was derive
Publikováno v:
SPIE Proceedings.
Phase-shifting Point Diffraction Interferometer (PSPDI) utilizing nearly perfect spherical wavefront diffracted by a pinhole as reference wavefront, which diminishes the influence of reference optics used in traditional interferometers, has been deve