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pro vyhledávání: '"Chung Huang Yeh"'
Autor:
Chung-Huang Yeh, Jwu-E Chen
Publikováno v:
Eng, Vol 4, Iss 4, Pp 3007-3025 (2023)
The digital integrated circuit (IC) testing model module is applied in this study to simulate the fabrication and testing of integrated circuits. The yield and quality of ICs are analyzed by assuming that the wafer devices under test conditions are n
Externí odkaz:
https://doaj.org/article/bba3669b01974c72a6084f2bb2ff5b3f
Autor:
Chung-Huang Yeh, Jwu E. Chen
Publikováno v:
IEEE Design & Test. 40:45-52
Autor:
Chung-Huang Yeh, Jwu-E Chen
Publikováno v:
Sensors, Vol 22, Iss 11, p 4158 (2022)
In this research, the normal distribution is assumed to be the product characteristic, and the DITM (Digital Integrated Circuit Test Model) model is used to evaluate the integrated circuits (IC) test yield and test quality. Testing technology lags fa
Externí odkaz:
https://doaj.org/article/f7b10b14325e4c6db44b792705e6d425
Autor:
Chung-Huang Yeh, Jwu E. Chen
Publikováno v:
Journal of Electronic Testing.
Autor:
Chung Huang Yeh, Jwu E. Chen
Publikováno v:
Journal of the Chinese Institute of Engineers. 43:279-287
In this work, we utilized a digital integrated-circuit (IC) testing model (DITM), based on a statistical simulation method, to evaluate the test yield and test quality of semiconductor prod...
Publikováno v:
Electronics; Volume 11; Issue 7; Pages: 1115
In this work, we use statistical concepts to evaluate the joint probability distribution of manufacturing and test parameters and estimate the future trend of wafer test yield. Owing to the difference between the development speeds of testing technol
Autor:
Chung-Huang Yeh, Jwu-E Chen
Publikováno v:
Electronics; Volume 10; Issue 23; Pages: 3032
Electronics, Vol 10, Iss 3032, p 3032 (2021)
Electronics, Vol 10, Iss 3032, p 3032 (2021)
An integrated-circuit testing model (DITM) is used to describe various factors that affect test yield during a test process. We used a probability distribution model to evaluate test yield and quality and introduced a threshold test and a guardband t
Autor:
Chung Huang Yeh, Jwu E. Chen
Publikováno v:
Journal of Electronic Testing. 35:459-472
The ultimate goal for all manufacturing industries is to construct products with zero defects and high quality to improve customer satisfaction. For the automotive electronics industry, which tends to have higher standards with regard to safety, the
Autor:
Chung-Huang Yeh, Jwu E. Chen
Publikováno v:
ITC-Asia
This study aims to exploit an integrated-circuit (IC) testing model based on a statistical simulation method to evaluate the test yield and quality of IC products. Using normal probability distributions of product properties, we digitally analyzed IC
Autor:
Chung-Huang Yeh, 葉宗皇
90
In this thesis, we provide a Model for the testing yield and the testing quality, and use the statistical simulation method in order to evaluate the joint probability distribution of a set of manufacturability and testability. By evaluating t
In this thesis, we provide a Model for the testing yield and the testing quality, and use the statistical simulation method in order to evaluate the joint probability distribution of a set of manufacturability and testability. By evaluating t
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/63686242768666624242