Zobrazeno 1 - 10
of 23
pro vyhledávání: '"Chung Huang Yeh"'
Autor:
Chung-Huang Yeh, Jwu-E Chen
Publikováno v:
Eng, Vol 4, Iss 4, Pp 3007-3025 (2023)
The digital integrated circuit (IC) testing model module is applied in this study to simulate the fabrication and testing of integrated circuits. The yield and quality of ICs are analyzed by assuming that the wafer devices under test conditions are n
Externí odkaz:
https://doaj.org/article/bba3669b01974c72a6084f2bb2ff5b3f
Autor:
Chung-Huang Yeh, Jwu E. Chen
Publikováno v:
IEEE Design & Test. 40:45-52
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5b067e0b2c98ed0139e6b7f707cf0244
https://doi.org/10.1109/mdat.2022.3221703
https://doi.org/10.1109/mdat.2022.3221703
Autor:
Chung-Huang Yeh, Jwu-E Chen
Publikováno v:
Sensors, Vol 22, Iss 11, p 4158 (2022)
In this research, the normal distribution is assumed to be the product characteristic, and the DITM (Digital Integrated Circuit Test Model) model is used to evaluate the integrated circuits (IC) test yield and test quality. Testing technology lags fa
Externí odkaz:
https://doaj.org/article/f7b10b14325e4c6db44b792705e6d425
Autor:
Chung-Huang Yeh, Jwu E. Chen
Publikováno v:
Journal of Electronic Testing.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b4eb8058da34012081d3987e99d56c51
https://doi.org/10.1007/s10836-023-06051-0
https://doi.org/10.1007/s10836-023-06051-0
Autor:
Chung Huang Yeh, Jwu E. Chen
Publikováno v:
Journal of the Chinese Institute of Engineers. 43:279-287
In this work, we utilized a digital integrated-circuit (IC) testing model (DITM), based on a statistical simulation method, to evaluate the test yield and test quality of semiconductor prod...
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fb0b939fbc21acfe49c463214094f6ad
https://doi.org/10.1080/02533839.2019.1708806
https://doi.org/10.1080/02533839.2019.1708806
Publikováno v:
Electronics; Volume 11; Issue 7; Pages: 1115
In this work, we use statistical concepts to evaluate the joint probability distribution of manufacturing and test parameters and estimate the future trend of wafer test yield. Owing to the difference between the development speeds of testing technol
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::53f0b11e02777432eb31f3d9e7a071b7
Autor:
Chung-Huang Yeh, Jwu-E Chen
Publikováno v:
Electronics; Volume 10; Issue 23; Pages: 3032
Electronics, Vol 10, Iss 3032, p 3032 (2021)
Electronics, Vol 10, Iss 3032, p 3032 (2021)
An integrated-circuit testing model (DITM) is used to describe various factors that affect test yield during a test process. We used a probability distribution model to evaluate test yield and quality and introduced a threshold test and a guardband t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::26beb491db7ba7979a90cdce1cd3b2ed
Autor:
Chung Huang Yeh, Jwu E. Chen
Publikováno v:
Journal of Electronic Testing. 35:459-472
The ultimate goal for all manufacturing industries is to construct products with zero defects and high quality to improve customer satisfaction. For the automotive electronics industry, which tends to have higher standards with regard to safety, the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::da8deb0c6570d48a0b8afee72c27f197
https://doi.org/10.1007/s10836-019-05812-0
https://doi.org/10.1007/s10836-019-05812-0
Autor:
Chung-Huang Yeh, Jwu E. Chen
Publikováno v:
ITC-Asia
This study aims to exploit an integrated-circuit (IC) testing model based on a statistical simulation method to evaluate the test yield and quality of IC products. Using normal probability distributions of product properties, we digitally analyzed IC
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8c2a9644eb37aecb71dbbb37a9fc257f
https://doi.org/10.1109/itc-asia51099.2020.00027
https://doi.org/10.1109/itc-asia51099.2020.00027
Autor:
Chung-Huang Yeh, 葉宗皇
90
In this thesis, we provide a Model for the testing yield and the testing quality, and use the statistical simulation method in order to evaluate the joint probability distribution of a set of manufacturability and testability. By evaluating t
In this thesis, we provide a Model for the testing yield and the testing quality, and use the statistical simulation method in order to evaluate the joint probability distribution of a set of manufacturability and testability. By evaluating t
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/63686242768666624242
