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pro vyhledávání: '"Chun-Chung Cheng"'
Autor:
Chun-Chung Cheng, 鄭竣中
106
With the rapid development of the semiconductor industry, the technology of fault detection and classification (FDC) is an important issue. Each machine in the process has a lot of sensors that record various types of parameters. Therefore,
With the rapid development of the semiconductor industry, the technology of fault detection and classification (FDC) is an important issue. Each machine in the process has a lot of sensors that record various types of parameters. Therefore,
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/hr5hk5
Autor:
Chun-Chung Cheng, 鄭春鐘
89
This dissertation is a study on the Chien-nien craftsman groups of Yungching, Changhua. Its purposes are to investigate the local craftsmen and to realize their origins, developing processes, systems, distribution, skills, and the characteris
This dissertation is a study on the Chien-nien craftsman groups of Yungching, Changhua. Its purposes are to investigate the local craftsmen and to realize their origins, developing processes, systems, distribution, skills, and the characteris
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/50207697458363419731
Publikováno v:
IEEE Transactions on Automation Science and Engineering. 17:1925-1936
Fault detection and classification (FDC) is important for semiconductor manufacturing to monitor equipment’s condition and examine the potential cause of the fault. Each equipment in the semiconductor manufacturing process is often accompanied by a
Autor:
Ching-Fuh Lin, Hong-Jhang Syu, Chuang Hung-Chieh, Huang Po-Jui, Meng-Jie Lin, Chun-Chung Cheng
Publikováno v:
Photonics Research. 7:1119
Structures capable of exciting localized surface plasmon resonance (LSPR) have been widely utilized to increase photoresponse in many photoactive devices. However, most LSPR can be induced in only a small spectral range and with particular polarizati