Zobrazeno 1 - 10
of 20
pro vyhledávání: '"Chun-Cheng Tsao"'
Autor:
Chun-cheng Tsao, 曹淳誠
103
This paper aims to explore a rhetorical perspective of televised financial News, which is a narrative. And Chosen “quantitative easing” (QE) report from a famous TV program “Sisy’s FINANCE WEEKLY” as a case study. By using narrativ
This paper aims to explore a rhetorical perspective of televised financial News, which is a narrative. And Chosen “quantitative easing” (QE) report from a famous TV program “Sisy’s FINANCE WEEKLY” as a case study. By using narrativ
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/he735w
Publikováno v:
International Symposium for Testing and Failure Analysis.
Convention hand polishing, which is widely used for delayering, is becoming increasingly difficult as metal lines and stacks in semiconductor devices get thinner. For one thing, endpointing at the exact targeted layer and region of interest is a majo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fa128d652b20ba6b7b725421db769119
https://doi.org/10.31399/asm.cp.istfa2021p0274
https://doi.org/10.31399/asm.cp.istfa2021p0274
Autor:
Hideo Tanaka, Chun-Cheng Tsao
Publikováno v:
Microelectronics Reliability. 114:113935
Circuit Edit (CE) techniques have been used for debug, characterization and prototyping. in the IC industry. CE jobs have become more complex to accomplish since the adaption of FinFET technology. Backside Si trenching as part of CE process is requir
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2f2e672a76dff1bf36dfb1524f8f52ac
https://doi.org/10.1016/j.microrel.2020.113935
https://doi.org/10.1016/j.microrel.2020.113935
Publikováno v:
2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
In this study we demonstrate the use of phase shift of lock-in thermography (LIT) a powerful technique in characterizing the Z profile of 2.5D packages. It is interesting to have a good understanding of how a given package structure correlates with L
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3b66d4bf979892e498f2fa0924268a1b
https://doi.org/10.1109/ipfa.2018.8452594
https://doi.org/10.1109/ipfa.2018.8452594
Publikováno v:
International Symposium for Testing and Failure Analysis.
This paper presents the success story of the learning process by reporting four cases using four different failure analysis techniques. The cases covered are IDDQ leakage, power short, scan chain hard failure, and register soft failure. Hardware invo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5d391952b0621cad88c3512f9d80ddad
https://doi.org/10.31399/asm.cp.istfa2016p0299
https://doi.org/10.31399/asm.cp.istfa2016p0299
Publikováno v:
Microelectronics Reliability. 42:1667-1672
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4102877aea0d495de301f1e2b72e1c84
https://doi.org/10.1016/s0026-2714(02)00209-3
https://doi.org/10.1016/s0026-2714(02)00209-3
Publikováno v:
Microelectronics Reliability. 41:1545-1549
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8f99ca759938f1f71ad11e738df3be69
https://doi.org/10.1016/s0026-2714(01)00171-8
https://doi.org/10.1016/s0026-2714(01)00171-8
Publikováno v:
Microelectronics Reliability. 39:957-961
We have developed a new, fully integrated circuit timing analysis tool that provides measurements of electrical waveforms by direct access to the diffusion nodes through the backside of CMOS integrated circuits. The system, known as the IDS 2000, all
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::341f4cad7766335c351eaa37f48906ce
https://doi.org/10.1016/s0026-2714(99)00130-4
https://doi.org/10.1016/s0026-2714(99)00130-4
Autor:
Mitchio Okumura, Chun-Cheng Tsao, Julio D. Lobo, Seth Blumberg, Theodore S. Dibble, Xu Zhang, Shui-Yin Lo
Publikováno v:
Journal of Applied Physics. 81:5896-5904
Time-of-flight measurements were made of neutral helium atom beams extracted from a repetitive, pulsed, positive-point corona discharge. Two strong neutral peaks, one fast and one slow, were observed, accompanied by a prompt photon peak and a fast io
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b7ffe22cd7d31189d1cf20cce04fd917
https://doi.org/10.1063/1.364376
https://doi.org/10.1063/1.364376
Publikováno v:
International Symposium for Testing and Failure Analysis.
Laser Voltage Imaging (LVI) has become a well-established method for isolating scan-shift (i.e., scan chain integrity) tests failures [1, 2]. When LVI is coupled with time-domain information acquired using Continuous-Wave Laser Voltage Probing (CW-LV
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1130ddd712ece822a8cda0c5727e9780
https://doi.org/10.31399/asm.cp.istfa2013p0322
https://doi.org/10.31399/asm.cp.istfa2013p0322