Zobrazeno 1 - 10
of 194
pro vyhledávání: '"Chun Hung Lai"'
Autor:
Huan-wei, Chen, Shan, Liao, Wan-Yee, Lau, Feng-jie, Wang, Fei-wen, Deng, Chun-hung, Lai Eric, Zuo-jun, Zhen
Publikováno v:
In International Journal of Surgery January 2015 13:297-301
Publikováno v:
Applied Sciences, Vol 9, Iss 7, p 1432 (2019)
A Cu/SiO2/Pt structure is usually used to study the resistive memory properties of an electrochemical resistive random access memory. It can be reversibly switched between low- and high-resistance states by using DC voltages in the atmosphere. Howeve
Externí odkaz:
https://doaj.org/article/5e8f856e3e984e5dbe0993880c5d9f4e
Publikováno v:
2022 8th International Conference on Applied System Innovation (ICASI).
Publikováno v:
Modern Physics Letters B. 36
A radio-frequency magnetron sputter was used to deposit a 60 nm TiO[Formula: see text] film on a W-coated Si substrate at room temperature. Subsequently, a 100 nm Ni film was deposited using a thermal evaporator to form a Ni/TiO[Formula: see text]/W
Autor:
Chun-Hung Lai1 brandon@nuu.edu.tw, Hung-Wei Chen1 hwchen@nuu.edu.tw, Chih-Yi Liu2 cyliu@cc.kuas.edu.tw
Publikováno v:
Materials (1996-1944). Jul2016, Vol. 9 Issue 7, p551. 9p. 5 Graphs.
Autor:
Xiao-Hui, Fu, Chun Hung, Lai Eric, Xiao-Ping, Yao, Kai-Jian, Chu, Shu-Qun, Cheng, Feng, Shen, Meng-Chao, Wu, Yee, Lau Wan
Publikováno v:
In The American Journal of Surgery 2009 198(2):184-187
Autor:
Wen-chang Lin, Chew-Wun Wu, Wen-Liang Fang, Chao-Yu Pan, Chun-Hung Lai, Hsiao-Wei Kao, Kuo Hung Huang
Publikováno v:
Oncotarget
// Hsiao-Wei Kao 1, * , Chao-Yu Pan 1, 2, * , Chun-Hung Lai 1 , Chew-Wun Wu 3 , Wen-Liang Fang 3 , Kuo-Hung Huang 3 and Wen-Chang Lin 1, 2 1 Institute of Biomedical Sciences, Academia Sinica, Taipei, Taiwan 2 Institute of Biomedical Informatics, Nati
Publikováno v:
Coatings, Vol 10, Iss 1146, p 1146 (2020)
Coatings
Volume 10
Issue 12
Coatings
Volume 10
Issue 12
In this work, two stacked gate dielectrics of Al2O3/tetraethyl-orthosilicate (TEOS) oxide were deposited by using the equivalent capacitance with 100-nm thick TEOS oxide on the patterned InGaZnO layers to evaluate the electrical characteristics and s
Publikováno v:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 26:663-670
The cache memory has been a predominant component in modern chips, easily taking up more than 50% of the silicon area. It is then desirable to make the cache memory flexible for different needs. Therefore, many modern processor chips allow users to c
Autor:
Yu Chuan Chen, Chun Hung Lai, Cheng-Hsing Hsu, Ching Fang Tseng, Wen Shiush Chen, Hsin Han Tung, Jenn Sen Lin
Publikováno v:
Materials Science Forum. 898:392-398
(Ca0.2Sr0.8)3(ZrxTi1-x)2O7 (x = 0.02-0.1) ceramic prepared by the solid state method was investigated for its microstructure and microwave dielectric properties. The correlation between the microstructure and microwave dielectric properties was also