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pro vyhledávání: '"Chun, Ji Hwan"'
Autor:
Chun, Ji Hwan
The growing demand for high performance systems in modern computing technology drives the development of advanced and high speed designs in I/O structures. Due to their data rate and architecture, however, testing of the high speed serial interfaces
Externí odkaz:
http://hdl.handle.net/2152/ETD-UT-2011-12-4460
Publikováno v:
2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS); 1/ 1/2012, p1-6, 6p
Publikováno v:
2012 IEEE 30th VLSI Test Symposium (VTS); 1/ 1/2012, p134-139, 6p
Publikováno v:
Proceedings of the 20th Symposium: Great Lakes Symposium on VLSI; 5/16/2010, p139-142, 4p
Publikováno v:
Proceedings of the 2010 Asia & South Pacific Design Automation Conference; 1/18/2010, p312-317, 6p
Publikováno v:
Proceedings of the 14th ACM Great Lakes Symposium: VLSI; 4/26/2004, p328-331, 4p