Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Chuck May"'
Publikováno v:
Process and Materials Characterization and Diagnostics in IC Manufacturing.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e13b19848178f52069eef8d0488ea24f
https://doi.org/10.1117/12.497615
https://doi.org/10.1117/12.497615
Autor:
Raymond T. Lee, Jon D. Cheek, Michael Duane, John L. Nistler, Robert Dawson, Jim Fulford, Dirk J Wristers, Chuck May, Fred N. Hause, Daniel Kadoch, Bernard W. K. Ho, Brad T. Moore, Mark W. Michael, Ming-Yin Hao, Deepak K. Nayak, Bijnan Bandyopadhyay, Mark I. Gardner
Publikováno v:
SPIE Proceedings.
A family of CMOS processing technologies used to produce AMDs fifth and sixth generation microprocessors (K5 and K6) is described. Some of the issues that arose during the technology development and the transfer to manufacturing are also presented. T
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a85645c7e3d255bfe19781be971fa6b4
https://doi.org/10.1117/12.284617
https://doi.org/10.1117/12.284617