Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Chuang Chun I"'
Autor:
Chuang Chun I, 莊俊逸
93
The Photoelastic Modulation Ellipsometer is used to measure an artificial circular polarizer (CP), which is a combination of a linear polarizer and a retarder. The multi-wavelength measurement technique is built up by using the Kr-Ar tunable
The Photoelastic Modulation Ellipsometer is used to measure an artificial circular polarizer (CP), which is a combination of a linear polarizer and a retarder. The multi-wavelength measurement technique is built up by using the Kr-Ar tunable
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/68221772101912764225
Publikováno v:
In Optics and Lasers in Engineering July 2013 51(7):861-866
Publikováno v:
In Optical Materials January 2013 35(3):366-371
Publikováno v:
In Thin Solid Films 28 February 2011 519(9):2867-2869
Publikováno v:
In Optics Communications 2010 283(17):3279-3283
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Publikováno v:
Optics Letters; 8/15/2011, Vol. 36 Issue 16, p3039-3041, 3p
Autor:
Chuang, Chun-I, 莊俊逸
101
In this research, we have developed a fast and accurate phase modulated ellipsometry/polarimetry. The optical parameters, the refractive indices and the Euler angles of three principal axes can all be extracted from the intensity waveform wi
In this research, we have developed a fast and accurate phase modulated ellipsometry/polarimetry. The optical parameters, the refractive indices and the Euler angles of three principal axes can all be extracted from the intensity waveform wi
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/r5832e