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Autor:
Rao Tummala, Christopher Schnitter, Nathan Neuhart, Markondeya Raj Pulugurtha, Kamil-Paul Rataj, Himani Sharma, Shubham Jain, Parthasarathi Chakraborti, Saumya Gandhi
Publikováno v:
IEEE Transactions on Components, Packaging and Manufacturing Technology. 6:1776-1784
This paper describes ultrathin tantalum-based high-volumetric-density power capacitors with low leakage properties for 1–10-MHz frequency applications. Nanodielectrics with low-defect density were grown on nanoporous tantalum anodes using the self-