Zobrazeno 1 - 10
of 40
pro vyhledávání: '"Christopher B. Wilkerson"'
Autor:
Christopher B. Wilkerson
Publikováno v:
MICRO-54: 54th Annual IEEE/ACM International Symposium on Microarchitecture.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f7e7b5b14968ece712e5861886b27409
https://doi.org/10.1145/3492782
https://doi.org/10.1145/3492782
Publikováno v:
IEEE Computer Architecture Letters. 16:88-93
DRAM cells in close proximity can fail depending on the data content in neighboring cells. These failures are called data-dependent failures . Detecting and mitigating these failures online while the system is running in the field enables optimizatio
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a31dbb13036d6829aa8c12bd004f34d1
https://doi.org/10.1109/lca.2016.2624298
https://doi.org/10.1109/lca.2016.2624298
Autor:
Alaa R. Alameldeen, Jagadish B. Kotra, Haibo Zhang, Mahmut Kandemir, Christopher B. Wilkerson
Publikováno v:
MICRO
Modern computing systems and applications have growing demand for memories with higher bandwidth. This demand can be alleviated using fast, large on-die or die-stacked memories. They are typically used with traditional DRAM as part of a heterogeneous
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::798352af18c4baf5fa099e013dffa72d
https://doi.org/10.1109/micro.2018.00050
https://doi.org/10.1109/micro.2018.00050
Publikováno v:
CF
Applications continue to increase their capacity requirements. Die-stacked DRAM caches have been proposed as a solution to filter as many accesses as possible to main memory. DRAM caches have been predominantly studied in the scenario where the next
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cce643bf0d5e10b6a28dc3000c92bd62
https://doi.org/10.1145/3203217.3203283
https://doi.org/10.1145/3203217.3203283
Autor:
Donghyuk Lee, Onur Mutlu, Christopher B. Wilkerson, Samira Khan, Zhe Wang, Alaa R. Alameldeen
Publikováno v:
MICRO
DRAM cells in close proximity can fail depending on the data content in neighboring cells. These failures are called data-dependent failures. Detecting and mitigating these failures online, while the system is running in the field, enables various op
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::59bc8374e31191fd1b730fa375ae06ea
https://doi.org/10.1145/3123939.3123945
https://doi.org/10.1145/3123939.3123945
Autor:
Onur Mutlu, Zeshan A. Chishti, Yoongu Kim, Christopher B. Wilkerson, Kevin K. Chang, Alaa R. Alameldeen, Donghyuk Lee
Modern DRAM cells are periodically refreshed to prevent data loss due to leakage. Commodity DDR DRAM refreshes cells at the rank level. This degrades performance significantly because it prevents an entire rank from serving memory requests while bein
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ac7c644395f8a20cf64cf5e1718f4926
Autor:
Donghyuk Lee, Christopher B. Wilkerson, Yoongu Kim, Ross Daly, Konrad K. Lai, Chris Fallin, Ji-Hye Lee, Jeremie S. Kim, Onur Mutlu
Publikováno v:
ISCA
Memory isolation is a key property of a reliable and secure computing system--an access to one memory address should not have unintended side effects on data stored in other addresses. However, as DRAM process technology scales down to smaller dimens
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0642eda4a00e1381270929c5417bfdb4
https://doi.org/10.1145/2678373.2665726
https://doi.org/10.1145/2678373.2665726
Autor:
Shih-Lien Lu, Bibiche M. Geuskens, Paolo Aseron, Carlos Tokunaga, Tanay Karnik, James W. Tschanz, Muhammad M. Khellah, Vivek De, Keith Bowman, Christopher B. Wilkerson, Arijit Raychowdhury
Publikováno v:
IEEE Journal on Emerging and Selected Topics in Circuits and Systems. 1:208-217
Built-in resiliency features enable a microprocessor to detect and correct errors due to fast dynamic voltage droop events as well as other types of dynamic variations. Timing errors in the microprocessor core as well as read (RD) and write (WR) erro
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ac5ce30c3c392fc9e6032fef7e4258ae
https://doi.org/10.1109/jetcas.2011.2167070
https://doi.org/10.1109/jetcas.2011.2167070
Publikováno v:
IEEE Transactions on Computers. 60:50-63
The performance/energy trade-off is widely acknowledged as a primary design consideration for modern processors. A less discussed, though equally important, trade-off is the reliability/energy trade-off. Many design features that increase reliability
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::33e391d88738f4855cf6605651af68a6
https://doi.org/10.1109/tc.2010.207
https://doi.org/10.1109/tc.2010.207
Autor:
Carlos Tokunaga, Tanay Karnik, Keith Bowman, Vivek De, Christopher B. Wilkerson, J. Tschanz, Bibiche M. Geuskens, Arijit Raychowdhury, Muhammad M. Khellah, Shih-Lien Lu, Paolo Aseron
Publikováno v:
IEEE Journal of Solid-State Circuits. 46:194-208
A 45 nm microprocessor core integrates resilient error-detection and recovery circuits to mitigate the clock frequency (FCLK) guardbands for dynamic parameter variations to improve throughput and energy efficiency. The core supports two distinct erro
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a0c382d60c28f537d7be93fbcf23dea8
https://doi.org/10.1109/jssc.2010.2089657
https://doi.org/10.1109/jssc.2010.2089657