Design and characterization of an integrated microwave generator for BIST applications

Autor: Philippe Descamps, Christophe Kelma, Olivier Tesson, Imene Lahbib, Mohamed Aziz Doukkali, Patrice Gamand

Publikováno v: International Journal of Microwave and Wireless Technologies
International Journal of Microwave and Wireless Technologies, Cambridge University Press/European Microwave Association 2014, 6 (2), pp.195-200. ⟨10.1017/S1759078714000105⟩

International audience; This paper presents a circuit architecture for a new integrated on chip test method for microwave circuits. The proposed built-in-self-test (BIST) cell targets a direct low-cost measurement technique of the gain and the 1 dB i

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::229215bbf78378ea4a5e75672789db20
https://hal.archives-ouvertes.fr/hal-02190952

Design of an embedded RF signal generator for BIST application

Autor: Mohamed-Aziz Doukkali, Christophe Kelma, Imene Lahbib, Olivier Tesson, Philippe Descarnps

Publikováno v: NEWCAS

This paper presents the design of an RF test signal generator for a Built-In-Self-Test (BIST) application. This embedded generator is the most sensitive part of a new BIST architecture which basically, consists of integrating an RF generator at the R

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::160658369c37996d892357065f8bb9e0
https://doi.org/10.1109/newcas.2013.6573661

Smart selection of indirect parameters for DC-based alternate RF IC testing

Autor: Michel Renovell, Olivier Potin, Haithem Ayari, Mariane Comte, Florence Azaïs, Serge Bernard, Vincent Kerzérho, Christophe Kelma

Publikováno v: VTS
VTS: VLSI Test Symposium
VTS: VLSI Test Symposium, Apr 2012, Hyatt Maui, HI, United States. pp.19-24, ⟨10.1109/VTS.2012.6231074⟩

International audience; In this paper, we investigate an alternate test strategy for RF integrated circuits based on DC measurements. A methodology to select the appropriate DC parameters is presented, that allows precise estimation of the DUT perfor

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5f5a99ed77815a1cae406348182ab86b
https://doi.org/10.1109/vts.2012.6231074

Towards cognitive built-in-self-test (BIST) for reconfigurable on-chip applications, and contact-less measurement

Autor: Christophe Kelma, Sidina Wane, Bilal Elkassir, Patrice Gamand, Manohiaina Ranaivoniarivo

Publikováno v: 2011 IEEE Radio Frequency Integrated Circuits Symposium.

This paper introduces the concept of cognitive wireless BIST system for reconfigurability of on-chip function blocks, towards contactless measurement and characterization of high frequency integrated systems. Proposed feasibility studies of cognitive

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::cbe74f6dcb61502e1de39ec14c08ec16
https://doi.org/10.1109/rfic.2011.5940716

Sensors for built-in alternate RF test

Autor: Louay Abdallah, Haralampos-G. Stratigopoulos, Salvador Mir, Christophe Kelma

Publikováno v: Proc. of IEEE European Test Symposium (ETS'10)
IEEE European Test Symposium (ETS'10)
IEEE European Test Symposium (ETS'10), May 2010, Prague, Czech Republic. pp.49-54, ⟨10.1109/ETSYM.2010.5512783⟩
European Test Symposium

ISBN 978-1-4244-5834-9; International audience; The paper discusses a variety of sensors to enable a built-in test in RF devices. The list of sensors includes dummy circuits, process control monitors, DC probes, an envelope detector, and a current se

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::238b4fdd6e2591663be6907459cb3a6b
https://hal.archives-ouvertes.fr/hal-00558886