Výsledky vyhledávání - "Christophe Garagnon"

Direct electrical transport measurement on a single thermoelectric nanowire embedded in an alumina template

Autor: Christophe Garagnon, Daniel Bourgault, Laurent Cagnon, Meriam Ben Khedim, Valerie Serradeil

Publikováno v: Physical Chemistry Chemical Physics
Physical Chemistry Chemical Physics, Royal Society of Chemistry, 2016, 18 (17), pp.12332-12337. ⟨10.1039/c6cp00972g⟩

Electrical conductivity is a key parameter to increase the performance of thermoelectric materials. However, the measurement of such performance remains complex for 1D structures, involving tedious processing. In this study, we present a non-destruct

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e8828e65cab615b7ce7e0ce4ab99d896
https://hal.archives-ouvertes.fr/hal-01971514

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Embedded memory fail analysis for production yield enhancement

Autor: Eric Faehn, Youssef Baltagi, Daniele Li Rosi, Christophe Garagnon, Mario Barone, V. Tancorre, Christophe Suzor, D. Appello

Publikováno v: 2011 IEEE/SEMI Advanced Semiconductor Manufacturing Conference.

The traditional approach for memory fail bitmap analysis is to identify the topological signatures and perform a Failure Analysis investigation on the most frequent signatures, based on the (x, y) coordinates of the fails. This approach is inappropri

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::fe160986d0bcf83dbd361c5bef1d49ed
https://doi.org/10.1109/asmc.2011.5898161

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Akademický článek

Contents list.

Publikováno v: Physical Chemistry Chemical Physics (PCCP); 5/7/2016, Vol. 18 Issue 17, p11563-11586, 24p

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Akademický článek

Direct electrical transport measurement on a single thermoelectric nanowire embedded in an alumina template.

Autor: Ben Khedim, Meriam, Cagnon, Laurent, Garagnon, Christophe, Serradeil, Valerie, Bourgault, Daniel

Publikováno v: Physical Chemistry Chemical Physics (PCCP); 5/7/2016, Vol. 18 Issue 17, p12332-12337, 6p

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Elektronická kniha

ISTFA 2012 : Conference Proceedings From the 38th International Symposium for Testing and Failure Analysis: November 11-15, 2012, Phoenix Convention Center, Phoenix, Arizona, USA

Autor: EDFAS Organizing Committee

This title features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect

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