Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Christoph Wilhelmer"'
Autor:
Christoph Wilhelmer, Dominic Waldhoer, Lukas Cvitkovich, Diego Milardovich, Michael Waltl, Tibor Grasser
Publikováno v:
Nanomaterials, Vol 13, Iss 16, p 2286 (2023)
Silicon nitride films are widely used as the charge storage layer of charge trap flash (CTF) devices due to their high charge trap densities. The nature of the charge trapping sites in these materials responsible for the memory effect in CTF devices
Externí odkaz:
https://doaj.org/article/cbe36dc38ea0429f892842124cd217d3
Autor:
Jasmina Obhod̵aš, Vladivoj Valković, Andrija Vinković, Davorin Sudac, Ivana Čanad̵ija, Tihana Pensa, Željka Fiket, Anna Turyanskaya, Thomas Bretschneider, Christoph Wilhelmer, Gerelmaa Gunchin, Peter Kregsamer, Peter Wobrauschek, Christina Streli
Publikováno v:
ACS Omega, Vol 6, Iss 35, Pp 22643-22654 (2021)
Externí odkaz:
https://doaj.org/article/43ef3dcccb1b4d1a8bf67278d81cae8c
Autor:
Diego Milardovich, Christoph Wilhelmer, Dominic Waldhoer, Lukas Cvitkovich, Ganesh Sivaraman, Tibor Grasser
Publikováno v:
The Journal of Chemical Physics. 158
Silicon nitride (Si3N4) is an extensively used material in the automotive, aerospace, and semiconductor industries. However, its widespread use is in contrast to the scarce availability of reliable interatomic potentials that can be employed to study
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::85212a4410bed220a51305ce96706607
https://doi.org/10.1063/5.0146753
https://doi.org/10.1063/5.0146753
Autor:
Christoph Wilhelmer, Dominic Waldhoer, Markus Jech, Al-Moatasem Bellah El-Sayed, Lukas Cvitkovich, Michael Waltl, Tibor Grasser
Publikováno v:
ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8cb2705c8ad50ecff2a154047580fdfa
https://doi.org/10.1109/essderc55479.2022.9947111
https://doi.org/10.1109/essderc55479.2022.9947111
Autor:
Lukas Cvitkovich, Dominic Waldhör, Al-Moatassem El-Sayed, Markus Jech, Christoph Wilhelmer, Tibor Grasser
Publikováno v:
Applied Surface Science. 610:155378
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a52e07947d3bd58149d0d4f6dc562cf0
https://doi.org/10.1016/j.apsusc.2022.155378
https://doi.org/10.1016/j.apsusc.2022.155378
Autor:
Christoph Wilhelmer, Dominic Waldhoer, Markus Jech, Al-Moatasem Bellah El-Sayed, Lukas Cvitkovich, Michael Waltl, Tibor Grasser
Publikováno v:
Microelectronics Reliability. 139:114801
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::091ab1d140973ed6e417d54c9c51a130
https://doi.org/10.1016/j.microrel.2022.114801
https://doi.org/10.1016/j.microrel.2022.114801
Autor:
Christoph Wilhelmer, Markus Jech, Dominic Waldhoer, Al-Moatasem Bellah El-Sayed, Lukas Cvitkovich, Tibor Grasser
Publikováno v:
ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::aeb930ae2de986848585ac2c61aa28e5
https://doi.org/10.1109/essderc53440.2021.9631833
https://doi.org/10.1109/essderc53440.2021.9631833