Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Christoph V. Heine"'
Autor:
Peter Schnauber, Alexander Thoma, Christoph V. Heine, Alexander Schlehahn, Liron Gantz, Manuel Gschrey, Ronny Schmidt, Caspar Hopfmann, Benjamin Wohlfeil, Jan-Hindrick Schulze, André Strittmatter, Tobias Heindel, Sven Rodt, Ulrike Woggon, David Gershoni, Stephan Reitzenstein
Publikováno v:
Technologies, Vol 4, Iss 1, p 1 (2015)
We report on enhancing the photon-extraction efficiency (PEE) of deterministic quantum dot (QD) microlenses via anti-reflection (AR) coating. The AR-coating deposited on top of the curved microlens surface is composed of a thin layer of Ta2O5, and is
Externí odkaz:
https://doaj.org/article/4e537bc2b40a4973810bdc8c95467831
Autor:
Sven Rodt, David Gershoni, Liron Gantz, Ronny Schmidt, Alexander Thoma, André Strittmatter, J.-H. Schulze, C. Hopfmann, Tobias Heindel, Alexander Schlehahn, Manuel Gschrey, Peter Schnauber, Ulrike Woggon, Christoph V. Heine, Benjamin Wohlfeil, Stephan Reitzenstein
Publikováno v:
Technologies, Vol 4, Iss 1, p 1 (2015)
Technologies; Volume 4; Issue 1; Pages: 1
Technologies; Volume 4; Issue 1; Pages: 1
We report on enhancing the photon-extraction efficiency (PEE) of deterministic quantum dot (QD) microlenses via anti-reflection (AR) coating. The AR-coating deposited on top of the curved microlens surface is composed of a thin layer of Ta2O5, and is