Zobrazeno 1 - 3 of 3 pro vyhledávání: '"Christoph Grupp"'
1
Oxidized silicon surfaces studied by high resolution Si 2p core-level photoelectron spectroscopy using synchrotron radiation
Autor: Christoph Grupp, François Rochet, Georges Dufour, F. Jolly, A. Taleb-Ibrahimi
Publikováno v: Journal of Non-Crystalline Solids. 280:150-155
The Si 2p soft X-ray photoemission study of various oxidized surfaces (thermal oxidation and room temperature (RT) oxidation) shows the benefit derived from the use of high-energy resolution (70 meV). Interesting structural information can be retriev
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::3d12f67eb86998f75ea367c987bc5497
https://doi.org/10.1016/s0022-3093(00)00370-7
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2
Oxidation of the H-Si(111)-1×1 surface: high resolution Si 2p core-level spectroscopy with synchrotron radiation
Autor: François Rochet, A. Taleb-Ibrahimi, Georges Dufour, Christoph Grupp, F. Jolly
Publikováno v: Surface Science. 463:102-108
The room temperature oxidation of H-terminated Si(111) surfaces by activated oxygen has been investigated using high resolution (70 meV) Si 2p core-level spectroscopy with synchrotron radiation. The data are compared with previous studies using photo
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::0a682382b2eb44d0540469016ca676b5
https://doi.org/10.1016/s0039-6028(00)00488-x
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