Zobrazeno 1 - 10
of 15
pro vyhledávání: '"Christina Ossig"'
Autor:
Christina Ossig, Christian Strelow, Jan Flügge, Svenja Patjens, Jan Garrevoet, Kathryn Spiers, Jackson L. Barp, Jr., Johannes Hagemann, Frank Seiboth, Michele De Bastiani, Erkan Aydin, Furkan H. Isikgor, Stefaan De Wolf, Gerald Falkenberg, Alf Mews, Christian G. Schroer, Tobias Kipp, Michael E. Stuckelberger
Publikováno v:
PRX Energy, Vol 3, Iss 2, p 023011 (2024)
Multimodal x-ray microscopy is key to assessing the property-functionality relationships of semiconductor devices with the utmost sensitivity and spatial resolution. Here, we report on a novel setup—the “Analyzer of X-ray excited Optical Luminesc
Externí odkaz:
https://doaj.org/article/aafdc750cc3f4c999cf9cafe66b008ea
Autor:
Giovanni Fevola, Christina Ossig, Mariana Verezhak, Jan Garrevoet, Harvey L. Guthrey, Martin Seyrich, Dennis Brückner, Johannes Hagemann, Frank Seiboth, Andreas Schropp, Gerald Falkenberg, Peter S. Jørgensen, Azat Slyamov, Zoltan I. Balogh, Christian Strelow, Tobias Kipp, Alf Mews, Christian G. Schroer, Shiro Nishiwaki, Romain Carron, Jens W. Andreasen, Michael E. Stuckelberger
Publikováno v:
Advanced Science, Vol 11, Iss 2, Pp n/a-n/a (2024)
Abstract Small voids in the absorber layer of thin‐film solar cells are generally suspected to impair photovoltaic performance. They have been studied on Cu(In,Ga)Se2 cells with conventional laboratory techniques, albeit limited to surface characte
Externí odkaz:
https://doaj.org/article/47a5b53e986041d0b480c3c5db3bebed
Autor:
Prerana Chakrabarti, Anna Wildeis, Markus Hartmann, Robert Brandt, Ralph Döhrmann, Giovanni Fevola, Christina Ossig, Michael Elias Stuckelberger, Jan Garrevoet, Ken Vidar Falch, Vanessa Galbierz, Gerald Falkenberg, Peter Modregger
Publikováno v:
Journal of Synchrotron Radiation, Vol 29, Iss 6, Pp 1407-1413 (2022)
X-ray diffraction with high spatial resolution is commonly used to characterize (poly)crystalline samples with, for example, respect to local strain, residual stress, grain boundaries and texture. However, the investigation of highly absorbing sample
Externí odkaz:
https://doaj.org/article/6160692d5bf84585be5db3cf013f94a8
Autor:
Christina Ossig, Christian Strelow, Jan Flügge, Andreas Kolditz, Jan Siebels, Jan Garrevoet, Kathryn Spiers, Martin Seyrich, Dennis Brückner, Niklas Pyrlik, Johannes Hagemann, Frank Seiboth, Andreas Schropp, Romain Carron, Gerald Falkenberg, Alf Mews, Christian G. Schroer, Tobias Kipp, Michael E. Stuckelberger
Publikováno v:
Materials, Vol 14, Iss 5, p 1189 (2021)
In the original version of our article [...]
Externí odkaz:
https://doaj.org/article/27a24a3621f544469c2127986f87230a
Autor:
Christina Ossig, Christian Strelow, Jan Flügge, Andreas Kolditz, Jan Siebels, Jan Garrevoet, Kathryn Spiers, Martin Seyrich, Dennis Brückner, Niklas Pyrlik, Johannes Hagemann, Frank Seiboth, Andreas Schropp, Romain Carron, Gerald Falkenberg, Alf Mews, Christian G. Schroer, Tobias Kipp, Michael E. Stuckelberger
Publikováno v:
Materials, Vol 14, Iss 1, p 228 (2021)
Inhomogeneities and defects often limit the overall performance of thin-film solar cells. Therefore, sophisticated microscopy approaches are sought to characterize performance and defects at the nanoscale. Here, we demonstrate, for the first time, th
Externí odkaz:
https://doaj.org/article/0c69c4c0eabe4fe0aa09dcfa4f0677d3
Autor:
Michele De Bastiani, Rawan Jalmood, Jiang Liu, Christina Ossig, Aleš Vlk, Karol Vegso, Maxime Babics, Furkan H. Isikgor, Anand S. Selvin, Randi Azmi, Esma Ugur, Swarnendu Banerjee, Alessandro J. Mirabelli, Erkan Aydin, Thomas G. Allen, Atteq Ur Rehman, Emmanuel Van Kerschaver, Peter Siffalovic, Michael E. Stuckelberger, Martin Ledinsky, Stefaan De Wolf
Publikováno v:
Advanced functional materials 33(4), 2205557 (2023). doi:10.1002/adfm.202205557
Advanced functional materials 33(4), 2205557 (2023). doi:10.1002/adfm.202205557
Textured silicon wafers used in silicon solar cell manufacturing offer superior light trapping, which is a critical enabler for high-performance photovoltaics. A sim
Textured silicon wafers used in silicon solar cell manufacturing offer superior light trapping, which is a critical enabler for high-performance photovoltaics. A sim
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::094e360532f40557f8a3b0a79dd0e34e
Autor:
Niklas Pyrlik, Christina Ossig, Giovanni Fevola, Svenja Patjens, Jan Hense, Catharina Ziska, Martin Seyrich, Frank Seiboth, Andreas Schropp, Jan Garrevoet, Gerald Falkenberg, Christian G. Schroer, Romain Carron, Michael E. Stuckelberger
Publikováno v:
2022 IEEE 49th Photovoltaics Specialists Conference (PVSC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3a89e80800bf7597becbd98b3e9a3260
https://doi.org/10.1109/pvsc48317.2022.9938960
https://doi.org/10.1109/pvsc48317.2022.9938960
Autor:
Svenja Patjens, Gerald Falkenberg, Catharina Ziska, Jackson Barp, Jan Hense, Martin Seyrich, Frank Seiboth, Michael Stuckelberger, Johannes Hagemann, Giovanni Fevola, Gero Falkenberg, Mikhail Lyubomirskiy, Christina Ossig, Jan Garrevoet, Niklas Pyrlik
Publikováno v:
2021 IEEE 48th Photovoltaic Specialists Conference (PVSC).
A fully encapsulated c-Si solar cell was evaluated using focused X-ray and laser beams to probe the microscopic electrical performance and composition. Particular emphasis was placed on the influence of the silver fingers on the laser (LBIC) and X-ra
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5506233c33db6f95f80735910498b2be
https://doi.org/10.1109/pvsc43889.2021.9518800
https://doi.org/10.1109/pvsc43889.2021.9518800
Autor:
Stuckelberger, Christina Ossig, Christian Strelow, Jan Flügge, Andreas Kolditz, Jan Siebels, Jan Garrevoet, Kathryn Spiers, Martin Seyrich, Dennis Brückner, Niklas Pyrlik, Johannes Hagemann, Frank Seiboth, Andreas Schropp, Romain Carron, Gerald Falkenberg, Alf Mews, Christian Schroer, Tobias Kipp, Michael
Publikováno v:
Materials; Volume 14; Issue 1; Pages: 228
Inhomogeneities and defects often limit the overall performance of thin-film solar cells. Therefore, sophisticated microscopy approaches are sought to characterize performance and defects at the nanoscale. Here, we demonstrate, for the first time, th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=multidiscipl::3d313c6f2af90d13786de94cc89dd6d0
Autor:
Andreas Kolditz, Niklas Pyrlik, Romain Carron, Gerald Falkenberg, Martin Seyrich, Jan Garrevoet, Jan Siebels, Tobias Kipp, Frank Seiboth, Johannes Hagemann, Dennis Brückner, Alf Mews, Jan Flügge, Kathryn Spiers, Andreas Schropp, Christian Strelow, Christian G. Schroer, Michael Stuckelberger, Christina Ossig
Publikováno v:
Materials 14(5), 1189 (2021). doi:10.3390/ma14051189
Materials, Vol 14, Iss 1189, p 1189 (2021)
Materials
Materials, Vol 14, Iss 1189, p 1189 (2021)
Materials
Materials 14(5), 1189 (2021). doi:10.3390/ma14051189
Published by MDPI, Basel
Published by MDPI, Basel
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e047ed3f4cbbe460dc0795992a7a72fa
https://bib-pubdb1.desy.de/record/473854
https://bib-pubdb1.desy.de/record/473854