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pro vyhledávání: '"Christian R. Engst"'
Publikováno v:
Materials, Vol 12, Iss 1, p 190 (2019)
Contactless minority carrier lifetime (lifetime) measurements by means of microwave detected photoconductivity are employed for oxidation process characterization and furnace profiling. Characterization is performed on oxidized float zone substrates
Externí odkaz:
https://doaj.org/article/49830f2d8d074c62bca30b02237feb80
Publikováno v:
Materials; Volume 12; Issue 1; Pages: 190
Contactless minority carrier lifetime (lifetime) measurements by means of microwave detected photoconductivity are employed for oxidation process characterization and furnace profiling. Characterization is performed on oxidized float zone substrates
Autor:
Christian. R. Engst, Marc Ablay, Giorgio Divitini, Caterina Ducati, Tim Liedl, Ulrich F. Keyser
Publikováno v:
Nano Letters; Jan2012, Vol. 12 Issue 1, p512-517, 6p