Zobrazeno 1 - 10
of 25
pro vyhledávání: '"Christian Obermair"'
Publikováno v:
Beilstein Journal of Nanotechnology, Vol 3, Iss 1, Pp 824-830 (2012)
We recently introduced a method that allows the controlled deposition of nanoscale metallic patterns at defined locations using the tip of an atomic force microscope (AFM) as a “mechano-electrochemical pen”, locally activating a passivated substr
Externí odkaz:
https://doaj.org/article/6e23dfab5e3e417a9ff11845b2d98cfe
Revealing thermal effects in the electronic transport through irradiated atomic metal point contacts
Autor:
Bastian Kopp, Zhiwei Yi, Daniel Benner, Fang-Qing Xie, Christian Obermair, Thomas Schimmel, Johannes Boneberg, Paul Leiderer, Elke Scheer
Publikováno v:
Beilstein Journal of Nanotechnology, Vol 3, Iss 1, Pp 703-711 (2012)
We report on the electronic transport through nanoscopic metallic contacts under the influence of external light fields. Various processes can be of relevance here, whose underlying mechanisms can be studied by comparing different kinds of atomic con
Externí odkaz:
https://doaj.org/article/fd0dbbbcc487445e90aeb2c78de4dbd8
Publikováno v:
Beilstein Journal of Nanotechnology, Vol 2, Iss 1, Pp 740-745 (2011)
We study the crossover of quantum point contacts from (i) individual-atom contacts to (ii) electronic-shell effects and finally to (iii) geometric-shell effects in electrochemically deposited silver contacts. The method allows the fabrication of mech
Externí odkaz:
https://doaj.org/article/9c3b61aa344a4a559bf3d06cc9323950
Publikováno v:
Beilstein Journal of Nanotechnology, Vol 2, Iss 1, Pp 659-664 (2011)
We demonstrate a method that allows the controlled writing of metallic patterns on the nanometer scale using the tip of an atomic force microscope (AFM) as a “mechano–electrochemical pen”. In contrast to previous experiments, no voltage is appl
Externí odkaz:
https://doaj.org/article/5a6179f00b754407beb04e346ba281fc
Autor:
Christian Obermair, Philipp Schmieder, Fangqing Xie, Thomas Schimmel, Florian Wertz, Andreas Peukert, Thorsten Bender
Publikováno v:
Advanced Materials. 30:1801225
The single-atom transistor represents a quantum electronic device at room temperature, allowing the switching of an electric current by the controlled and reversible relocation of one single atom within a metallic quantum point contact. So far, the d
Publikováno v:
Advanced Materials. 22:2033-2036
Publikováno v:
Solid State Communications. 132:437-442
The demonstration of a multi-atom quantum point contact relay is reported, which can be reversibly switched between a quantized conducting ‘on-state’ and an insulating ‘off-state’ by applying an electrochemical control potential to a separate
Autor:
Thomas Fiedler, Thomas Schimmel, Christian Obermair, Roland Gröger, Thomas Koch, Matthias M. Müller, Stefan Walheim
Publikováno v:
Surface and Interface Analysis. 36:189-192
We demonstrate the controlled and reproducible structuring of surfaces of muscovite mica with the tip of an atomic force microscope operated in contact mode under ambient conditions. By repeated scanning of the tip along a predefined pattern on a cle
Publikováno v:
Physical Review B. 57:7506-7509
The dependence of Andreev reflection on the heavy-fermion superconductor ${\mathrm{UPt}}_{3}$ on surface conditions has been investigated by means of point-contact spectroscopy. In contrast to conventional superconductors the surface is expected to p
Publikováno v:
Beilstein Journal of Nanotechnology
Beilstein Journal of Nanotechnology, Vol 3, Iss 1, Pp 824-830 (2012)
Beilstein Journal of Nanotechnology, Vol 3, Iss 1, Pp 824-830 (2012)
We recently introduced a method that allows the controlled deposition of nanoscale metallic patterns at defined locations using the tip of an atomic force microscope (AFM) as a “mechano-electrochemical pen”, locally activating a passivated substr