Zobrazeno 1 - 10
of 55
pro vyhledávání: '"Christian J Long"'
Autor:
Angela C. Stelson, Minghui Liu, Charles A. E. Little, Christian J. Long, Nathan D. Orloff, Nicholas Stephanopoulos, James C. Booth
Publikováno v:
Nature Communications, Vol 10, Iss 1, Pp 1-9 (2019)
Methods to study conformational changes in biomolecules are limited in resolution and require labelling or other modifications of target analytes. Here the authors present a label-free, microwave microfluidic approach to detect conformational changes
Externí odkaz:
https://doaj.org/article/bad0e280e28c4df1bd9cab8f703da332
Publikováno v:
IEEE Transactions on Microwave Theory and Techniques. 70:2743-2749
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::650260c1ceffa03f25eb3fb1f992859b
https://doi.org/10.1109/tmtt.2022.3155466
https://doi.org/10.1109/tmtt.2022.3155466
Autor:
Christian J. Long, Dylan F. Williams, Nathan D. Orloff, Ari F Feldman, Bryan Bosworth, Kassiopeia Smith, Richard A. Chamberlin, Miguel Urteaga, N. R. Jungwirth, Jerome Cheron
Publikováno v:
IEEE Transactions on Terahertz Science and Technology. 12:63-69
The indium phosphide (InP) 130 nm double-heterojunction bipolar transistor (DHBT) offers milliwatts of output power and high signal amplification in the lower end of the terahertz frequency band when the transistor is used in a common-base configurat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5ddb0c7339db0d60d6401047c5836cee
https://doi.org/10.1109/tthz.2021.3119999
https://doi.org/10.1109/tthz.2021.3119999
Publikováno v:
Beilstein Journal of Nanotechnology, Vol 5, Iss 1, Pp 1637-1648 (2014)
We present an exploratory study of multimodal tapping-mode atomic force microscopy driving more than three cantilever eigenmodes. We present tetramodal (4-eigenmode) imaging experiments conducted on a thin polytetrafluoroethylene (PTFE) film and comp
Externí odkaz:
https://doaj.org/article/db83135213044b2cb7230b80b2f3e948
Autor:
T. Mitch Wallis, Charles A. E. Little, Richard A. Chamberlin, George L. Burton, Nathan D. Orloff, Christian J. Long, Kubilay Sertel
Publikováno v:
2022 99th ARFTG Microwave Measurement Conference (ARFTG).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8d4ec06720c9ecf98bce6659da2449c3
https://doi.org/10.1109/arftg54656.2022.9896540
https://doi.org/10.1109/arftg54656.2022.9896540
Autor:
Edward J. Garboczi, Evan A. Schlomann, Alec Weiss, Nathan D. Orloff, Christian J. Long, Nina Popovic, Ross A. Rentz
Publikováno v:
IEEE Transactions on Microwave Theory and Techniques. 68:4913-4924
Applications of anisotropic composite materials range from construction composites to electric circuit boards. Anisotropic conductivity is one of the many important measurands for anisotropic composites for identifying misalignment. However, there ar
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::12f28dbbac7f56a688d84434f2ac0b3c
https://doi.org/10.1109/tmtt.2020.3010836
https://doi.org/10.1109/tmtt.2020.3010836
Autor:
Bryan T. Bosworth, Nick R. Jungwirth, Kassiopeia Smith, Jerome Cheron, Franklyn Quinlan, Madison Woodson, Jesse Morgan, Andreas Beling, Ari Feldman, Dylan Williams, Nathan D. Orloff, Christian J. Long
Publikováno v:
Conference on Lasers and Electro-Optics.
We demonstrate fine phase and amplitude control of millimeter-waves, measured on-wafer using an electro-optic frequency comb, programmable spectral filter, and uni-traveling carrier photodiode. We then synthesize arbitrary waveforms with 100 GHz of b
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6ed3795543f9df9d65e8b8d03af05150
https://doi.org/10.1364/cleo_at.2022.aw5l.1
https://doi.org/10.1364/cleo_at.2022.aw5l.1
Autor:
Jerome Cheron, Rob D. Jones, Richard A. Chamberlin, Dylan F. Williams, Miguel E. Urteaga, Kassiopeia A. Smith, Nicholas R. Jungwirth, Bryan T. L. Bosworth, Christian J. Long, Nathan D. Orloff, Peter H. Aaen, Ari D. Feldman
Publikováno v:
2021 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8a57ff586aac63c0aef432fa531ee0e2
https://doi.org/10.1109/bcicts50416.2021.9682464
https://doi.org/10.1109/bcicts50416.2021.9682464
Autor:
Xiaohai Cui, Wenze Yuan, Sheng Ding, Xiaomeng Liu, Jinwen Liu, Djamel Allal, Jürgen Rühaak, Karsten Kuhlmann, Yuya Tojima, Moto Kinoshita, Jae-Yong Kwon, Tae-Weon Kang, Vladimir A Perepelkin, Igor P Chirkov, Alexey I Matveev, Daniel Stokes, Aaron M Hagerstrom, Angela C Stelson, Jeffrey A Jargon, Dazhen Gu, Christian J Long, François Ziadé
Publikováno v:
Metrologia. 60:01001
Main text This report summarizes the results of the measurements performed as a CIPM Key Comparison (CCEM.RF-K27.W) on high frequency power in waveguide among eight National Metrology Institutes (NMIs) of Germany (PTB), UK (NPL), France (LNE), China
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::72f66a107bf211dce4346482e5218526
https://doi.org/10.1088/0026-1394/60/1a/01001
https://doi.org/10.1088/0026-1394/60/1a/01001
Autor:
Jasper Drisko, Christian J. Long, James C. Booth, Nathan D. Orloff, Nina Popovic, Edward J. Garboczi, Aaron M. Hagerstrom
Publikováno v:
IEEE Transactions on Microwave Theory and Techniques. 68:184-195
Understanding the electrical properties of materials is a necessary part of any microwave circuit design. In this article, we explore the possibility of employing multiple-offset-reflect devices for on-wafer materials characterization at frequencies
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e5b539a15296629d5650850a2cadfdc3
https://doi.org/10.1109/tmtt.2019.2950023
https://doi.org/10.1109/tmtt.2019.2950023