Zobrazeno 1 - 10
of 105
pro vyhledávání: '"Christian Gautier"'
Autor:
Emmanuelle Deniaud, Joël Baguet, Roxane Chalard, Bariza Blanquier, Lilia Brinza, Julien Meunier, Marie-Cécile Michallet, Aurélie Laugraud, Claudette Ah-Soon, Anne Wierinckx, Marc Castellazzi, Joël Lachuer, Christian Gautier, Jacqueline Marvel, Yann Leverrier
Publikováno v:
PLoS ONE, Vol 4, Iss 9, p e7035 (2009)
BACKGROUND:The ubiquitous transcription factor Sp1 regulates the expression of a vast number of genes involved in many cellular functions ranging from differentiation to proliferation and apoptosis. Sp1 expression levels show a dramatic increase duri
Externí odkaz:
https://doaj.org/article/ae0710a8778145e6b510f9773b028cd9
Autor:
Kassem Hamze, Philippe Descamps, Cedric Mayor, Daniel Pasquet, Christian Gautier, Dominique Lesenechal
Publikováno v:
2018 22nd International Microwave and Radar Conference (MIKON).
The variation of the linear inductance of a CPW with the frequency is used to extract the effective permeability that depends on the metallic losses. The result allows to separate the dielectric and metallic losses and to calculate some characteristi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::970946932fa95cf57bc2ba2a017d34b7
https://doi.org/10.23919/mikon.2018.8405318
https://doi.org/10.23919/mikon.2018.8405318
Autor:
Franck Bayle, Dan Borza, Pierre Richard Dahoo, Philippe Descamps, Pascal Dherbecourt, Abdelkhalak El Hami, Philippe Eudeline, Maxime Fontaine, Christian Gautier, Eric Joubert, Moncef Kadi, Alain Kamdel, Samh Khemiri, Malika Khettab, Ludovic Lacheze, Olivier Latry, Jorge Linares, Hichame Maanane, Patrick Martin, Ioana Nistea, Hubert Polaert, Philippe Pougnet, Bouchaïb Radi, Abhishek Ramanujan, Zouheir Riah
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a2a79edfb444707fecdd52fa022dcd3a
https://doi.org/10.1016/b978-1-78548-260-1.50018-2
https://doi.org/10.1016/b978-1-78548-260-1.50018-2
Autor:
O. van der Sluis, Xiaosong Ma, Guoqi Zhang, C. Regards, W.D. van Driel, Hélène Fremont, K.M.B. Jansen, L.J. Ernst, Christian Gautier
Publikováno v:
Microelectronics Reliability. 50:1654-1660
In this paper, a fast moisture sensitivity level (MSL) qualification method and a fast moisture characterization method are discussed. The fast moisture characterization uses a stepwise method to obtain more reliable and more material moisture proper
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4e94bdd4f6a441e24d7666f586427e20
https://doi.org/10.1016/j.microrel.2010.07.066
https://doi.org/10.1016/j.microrel.2010.07.066
Publikováno v:
Microelectronics Reliability. 49:952-957
For the last 30 years, the electronic industry made many efforts to reduce ESD failure rates. Consequently EOS failure rate can be the dominant one. Concerned by zero defect program and EOS failure rate from customer complaints, NXP Semiconductors de
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::af0899a103a9d3ab0c5b744f4fe30d28
https://doi.org/10.1016/j.microrel.2009.07.030
https://doi.org/10.1016/j.microrel.2009.07.030
Autor:
Kaspar M. B. Jansen, Hélène Fremont, M.A. Xiaosong, Patrick Poirier, Charles Regard, Christian Gautier
Publikováno v:
Microelectronics Reliability. 49:958-962
For the purpose of rapidly identifying the functional weak points of SiP products and defining appropriate design rules, a new methodology is proposed to achieve fast reliability qualification. This new methodology is based on the moisture absorption
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e8bcbc2b23054137863bc54f34622f63
https://doi.org/10.1016/j.microrel.2009.07.042
https://doi.org/10.1016/j.microrel.2009.07.042
Autor:
Marília D. V. Braga, Christian Gautier, Eric Tannier, Claire Lemaitre, Marie-France Sagot, Gabriel A. B. Marais
Publikováno v:
Genome Biology and Evolution
The human sex chromosomes have stopped recombining gradually, which has left five evolutionary strata on the X chromosome. Y inversions are thought to have suppressed X-Y recombination but clear evidence is missing. Here, we looked for such evidence
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3f14a9bfe6f98dee0982e6f401329dad
http://europepmc.org/articles/PMC2817401
http://europepmc.org/articles/PMC2817401
Autor:
Patrice Andre, Laurène Meyniel, Stéphane Delmotte, Christian Gautier, Vincent Lotteau, Chantal Rabourdin-Combe, Benoît de Chassey, Vincent Navratil
Publikováno v:
Nucleic Acids Research
Nucleic Acids Research, Oxford University Press, 2008,--, pp.1-8
Nucleic Acids Research, Oxford University Press, 2009, 37, pp.D661-D668. ⟨10.1093/nar/gkn794⟩
Nucleic Acids Research, 2009, 37, pp.D661-D668. ⟨10.1093/nar/gkn794⟩
Nucleic Acids Research (37), D661-D668. (2009)
Nucleic Acids Research, Oxford University Press, 2008,--, pp.1-8
Nucleic Acids Research, Oxford University Press, 2009, 37, pp.D661-D668. ⟨10.1093/nar/gkn794⟩
Nucleic Acids Research, 2009, 37, pp.D661-D668. ⟨10.1093/nar/gkn794⟩
Nucleic Acids Research (37), D661-D668. (2009)
International audience; Infectious diseases caused by viral agents kill millions of people every year. The improvement of prevention and treatment of viral infections and their associated diseases remains one of the main public health challenges. Tow
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4f30056895b546f4f8486004cb7aed50
https://doi.org/10.1093/nar/gkn794
https://doi.org/10.1093/nar/gkn794
Autor:
Vincent Georgel, Sophie Ledain, Karine Danilo, Matthieu Nongaillard, Christian Gautier, Sébastien Jacqueline
Publikováno v:
Microelectronics Reliability. 48:1258-1262
Because of its large dimension and its high level of integration, the PICS (Passive Integration Connecting Substrate) developed by NXP prone to top to bottom metal short (TBMS) failure during temperature cycling test. Several options of process modif
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d7f7ea1d03ee210c2e86dffdd50ce204
https://doi.org/10.1016/j.microrel.2008.07.033
https://doi.org/10.1016/j.microrel.2008.07.033
Publikováno v:
Embedded Mechatronic Systems 2
Embedded Mechatronic Systems 2, Elsevier, pp.49-77, 2015, ⟨10.1016/B978-1-78548-014-0.50003-7⟩
Embedded Mechatronic Systems 2, Elsevier, pp.49-77, 2015, ⟨10.1016/B978-1-78548-014-0.50003-7⟩
This chapter presents the failure analysis methods used for mechatronics systems. The advantages and disadvantages of resin and ceramic casing opening methods are described as well as the use precautions which are required to maintain the functional
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ad33b3fd0204ee443f12c34de8d9e46a
https://hal.science/hal-02130929
https://hal.science/hal-02130929