Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Christian C. Russ"'
Autor:
Russ Mohn, Koen Verhaege, John Armer, Markus Paul Josef Mergens, Christian C. Russ, Phillip Czeslaw Jozwiak
Publikováno v:
Microelectronics Reliability. 43:993-1000
This paper presents a novel Silicon Controlled Rectifier (SCR) for power line and local I/O ESD protection. The High holding current SCRs (HHI-SCR) exhibits a dual ESD clamp characteristic: low-current high-voltage clamping and high-current low-volta
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f3fe49828e6bc3391351e4eb40340001
https://doi.org/10.1016/s0026-2714(03)00125-2
https://doi.org/10.1016/s0026-2714(03)00125-2
Autor:
Phillip Czeslaw Jozwiak, Markus Paul Josef Mergens, John Armer, K. Verhaege, Christian C. Russ
Publikováno v:
Microelectronics Reliability. 42:3-13
This paper presents three novel design techniques, which combined fulfill all major requirements posed on large driver and electrostatic discharge (ESD) protection transistors: minimum area consumption, good ESD robustness and optimized normal operat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::48ead063ea84bf8c28f3438eb0d515d6
https://doi.org/10.1016/s0026-2714(01)00237-2
https://doi.org/10.1016/s0026-2714(01)00237-2
Autor:
K. Verhaege, Christian C. Russ
Publikováno v:
Microelectronics Reliability. 41:1739-1749
A universal technique to design cost effective, fully silicided, high performance ESD devices is introduced [All rights reserved – Patents Pending]. This novel design solution can be implemented straightforwardly without process modifications. ESD
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f46942ed5ebbe7e78ce8f398f5a33df8
https://doi.org/10.1016/s0026-2714(01)00030-0
https://doi.org/10.1016/s0026-2714(01)00030-0
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