Zobrazeno 1 - 10
of 164
pro vyhledávání: '"Christian Boit"'
Publikováno v:
Transactions on Cryptographic Hardware and Embedded Systems, Vol 2018, Iss 3 (2018)
Thermal laser stimulation (TLS) is a failure analysis technique, which can be deployed by an adversary to localize and read out stored secrets in the SRAM of a chip. To this date, a few proof-of-concept experiments based on TLS or similar approaches
Externí odkaz:
https://doaj.org/article/5f100a8d27914d6f847b31ff4267741c
Autor:
Norbert Herfurth, Christian Boit
Publikováno v:
EDFA Technical Articles. 24:4-11
This article presents and evaluates a calibration method that significantly improves the spectral information that can be extracted from photon emission signals obtained from semiconductor devices. Step-by-step instructions are given for calibrating
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::de98975e35294f3968ace066175c73a7
https://doi.org/10.31399/asm.edfa.2022-4.p004
https://doi.org/10.31399/asm.edfa.2022-4.p004
Autor:
Christian Boit
Publikováno v:
International Symposium for Testing and Failure Analysis.
This presentation provides an overview of photonic measurement techniques and their use in isolating faults and locating defects in ICs. It covers transmission, reflectance, and absorption methods, describing key interactions and important parameters
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9558525c353a505450781214642aa3a5
https://doi.org/10.31399/asm.cp.istfa2022tpd1
https://doi.org/10.31399/asm.cp.istfa2022tpd1
Autor:
Catalina Abad, Iago Pinal-Fernandez, Clement Guillou, Gwladys Bourdenet, Laurent Drouot, Pascal Cosette, Margherita Giannini, Lea Debrut, Laetitia Jean, Sophie Bernard, Damien Genty, Rachid Zoubairi, Isabelle Remy-Jouet, Bernard Geny, Christian Boitard, Andrew Mammen, Alain Meyer, Olivier Boyer
Publikováno v:
Nature Communications, Vol 15, Iss 1, Pp 1-18 (2024)
Abstract Idiopathic inflammatory myopathies (IIMs) are severe autoimmune diseases with poorly understood pathogenesis and unmet medical needs. Here, we examine the role of interferon γ (IFNγ) using NOD female mice deficient in the inducible T cell
Externí odkaz:
https://doaj.org/article/5feb3ed90f3c49a49fed689d6693d55c
Autor:
Jean Van Rampelbergh, Peter Achenbach, Richard David Leslie, Martin Kindermans, Frédéric Parmentier, Vincent Carlier, Nicolas Bovy, Luc Vanderelst, Marcelle Van Mechelen, Pierre Vandepapelière, Christian Boitard
Publikováno v:
BMC Medicine, Vol 22, Iss 1, Pp 1-13 (2024)
Abstract Background IMCY-0098, a synthetic peptide developed to halt disease progression via elimination of key immune cells in the autoimmune cascade, has shown a promising safety profile for the treatment of type 1 diabetes (T1D) in a recent phase
Externí odkaz:
https://doaj.org/article/3ea8c33bb1fa4f08a58cae9c56d17631
Autor:
Christian Boit
Publikováno v:
International Symposium for Testing and Failure Analysis.
This presentation provides an overview of photonic measurement techniques and their use in isolating faults and locating defects in ICs. It covers transmission, reflectance, and absorption methods, describing key interactions and important parameters
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f171ac8849ea7a3042ba1cc8b1135fd4
https://doi.org/10.31399/asm.cp.istfa2021tpd1
https://doi.org/10.31399/asm.cp.istfa2021tpd1
Autor:
Jean-Pierre Seifert, Tuba Kiyan, Christian Boit, Zarin Shakibaei, Thilo Krachenfels, Elham Amini
Publikováno v:
2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3bdebbc42d66b5a0ba7072299e0eb676
https://doi.org/10.1109/ipfa53173.2021.9617414
https://doi.org/10.1109/ipfa53173.2021.9617414
Publikováno v:
Microelectronics Reliability. 92:143-148
In the last decade it has become increasingly popular to use germanium enriched silicon in modern field effect transistors (FET) due to the higher intrinsic mobility of both holes and electrons in SiGe as compared to Si. Whether used in the source/dr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::70b9b43be045c1f0391433b80b8c0c19
https://doi.org/10.1016/j.microrel.2018.11.008
https://doi.org/10.1016/j.microrel.2018.11.008
Autor:
I. De Wolf, K. Croes, Frank Altmann, Michél Simon-Najasek, A. Beyreuther, N. Herfurth, Christian Boit, T. Nakamura, C. Wu
Publikováno v:
Microelectronics Reliability. 92:73-78
For the first time a non-invasive localisation of a soft breakdown (SBD) is shown. The localisation is completed on fully functional back end of line (BEOL) test structures. The test structures used, provided by the interuniversity microelectronics c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::60711bd76f181525455c3c48a3e5a591
https://doi.org/10.1016/j.microrel.2018.11.009
https://doi.org/10.1016/j.microrel.2018.11.009
Autor:
Marius Eggert, Thilo Krachenfels, Christian Boit, N. Herfurth, Shahin Tajik, Elham Amini, Kai Bartels, Jean-Pierre Seifert, Tuba Kiyan
Publikováno v:
VTS
This paper reviews the evolution of a powerful class of physical attacks against integrated circuits (ICs), developed initially for performing failure analysis (FA) from the IC backside. Over the last two decades, several publications have demonstrat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::61bd80bcfcc82ea19e2e1bd2833e8c85
https://doi.org/10.1109/vts50974.2021.9441006
https://doi.org/10.1109/vts50974.2021.9441006