Výsledky vyhledávání - "Christian, Schober"

Akademický článek

Tilted Wave Fizeau Interferometer for flexible and robust asphere and freeform testing

Autor: Christian Schober, Rolf Beisswanger, Antonia Gronle, Christof Pruss, Wolfgang Osten

Publikováno v: Light: Advanced Manufacturing, Vol 3, Pp 1-12 (2022)

Tilted Wave Interferometry (TWI) is a measurement technique for fast and flexible interferometric testing of aspheres and freeform surfaces. The first version of the tilted wave principle was implemented in a Twyman-Green type setup with separate ref

Externí odkaz: https://doaj.org/article/4236540b6ec0472caf25b69d27ef6cd0

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Akademický článek

Traceable Reference Full Metrology Chain for Innovative Aspheric and Freeform Optical Surfaces Accurate at the Nanometer Level

Autor: Yassir Arezki, Rong Su, Ville Heikkinen, François Leprete, Pavel Posta, Youichi Bitou, Christian Schober, Charyar Mehdi-Souzani, Bandar Abdulrahman Mohammed Alzahrani, Xiangchao Zhang, Yohan Kondo, Christof Pruss, Vit Ledl, Nabil Anwer, Mohamed Lamjed Bouazizi, Richard Leach, Hichem Nouira

Publikováno v: Sensors, Vol 21, Iss 4, p 1103 (2021)

The design of innovative reference aspheric and freeform optical elements was investigated with the aim of calibration and verification of ultra-high accurate measurement systems. The verification is dedicated to form error analysis of aspherical and

Externí odkaz: https://doaj.org/article/5e208ae826204d198959010b0780b38d

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Ereignisbasierte Weißlichtinterferometrie (eCSI)

Autor: Christian Schober, Christof Pruss, Alois Herkommer

Publikováno v: tm - Technisches Messen. 89:413-420

Zusammenfassung In diesem Beitrag wird ein scannendes, ereignisbasiertes Weißlichtinterferometriemesssystem (eCSI) in Verbindung mit der Nanomess- und Positioniermaschine NPMM-200 vorgestellt. Die scannende Kurzkohärenzinterferometrie wird in der F

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::96d58a1eb2ee2b977b1284385b208c7f
https://doi.org/10.1515/teme-2021-0130

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Accurate single image depth detection using multiple rotating point spread functions

Autor: Simon, Hartlieb, Christian, Schober, Tobias, Haist, Stephan, Reichelt

Publikováno v: Optics express. 30(13)

In this article we present the simulation and experimental implementation of a camera-based sensor with low object-space numerical aperture that is capable of measuring the distance of multiple object points with an accuracy of 8.51 µm over a range

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=pmid________::b13efa4141b6760e7933e9bca16ef170
https://pubmed.ncbi.nlm.nih.gov/36224992

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Field evaluation of a novel holographic single-image depth reconstruction sensor

Autor: Simon Hartlieb, Christian Schober, Tobias Haist, Stephan Reichelt

Publikováno v: Journal of the European Optical Society-Rapid Publications. 19:20

A camera-based single-image sensor is presented, that is able to measure the distance of one or multiple object points (light emitters). The sensor consists of a camera, whose lens is upgraded with a diffractive optical element (DOE). It fulfils two

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::6ee4a1fd499b76d162c25dda30a6deec
https://doi.org/10.1051/jeos/2023017

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Event based coherence scanning interferometry

Autor: Alois Herkommer, Christian Schober, Christof Pruss, Andreas Faulhaber

Publikováno v: Optics letters. 46(17)

Coherence scanning interferometry enables high precision measurements in manifold research and industry applications. In most modern systems, a digital camera (CCD/CMOS) is used to record the interference signals for each pixel. When measuring steep

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b40ea307fe6bacfc144094be30e22d4f
https://pubmed.ncbi.nlm.nih.gov/34470020

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Epitaxy and Shape Heterogeneity of a Nanoparticle Ensemble during Redox Cycles

Autor: Simon Chung, Azat Khadiev, Dmitri Novikov, Andreas Stierle, Daniel Schmidt, Jan-Christian Schober, Steffen Tober, Vedran Vonk

Publikováno v: ACS nano 15(8), 13267 – 13278 (2021). doi:10.1021/acsnano.1c03002

ACS nano xx, acsnano.1c03002 (1-12) (2021). doi:10.1021/acsnano.1c03002
The role of metal–support epitaxy on shape and size heterogeneity of nanoparticles and their response to gas atmospheres is not very well explored. Here we show that an en

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5a630b56f4643c02ecee3daaba5d2428
https://bib-pubdb1.desy.de/record/462289

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Traceable reference full metrology chain for innovative aspheric and freeform optical surfaces accurate at the nanometer level

Autor: Mohamed Lamjed Bouazizi, Bandar Alzahrani, Youichi Bitou, Vít Lédl, Nabil Anwer, Xiangchao Zhang, Hichem Nouira, Ville Heikkinen, Yassir Arezki, Yohan Kondo, Rong Su, Christof Pruss, Charyar Mehdi-Souzani, Richard Leach, François Leprete, Pavel Posta, Christian Schober

Publikováno v: Arezki, Y, Su, R, Heikkinen, V, Leprete, F, Posta, P, Bitou, Y, Schober, C, Mehdi-Souzani, C, Alzahrani, B A M, Zhang, X, Kondo, Y, Pruss, C, Ledl, V, Anwer, N, Bouazizi, M L, Leach, R & Nouira, H 2021, ' Traceable reference full metrology chain for innovative aspheric and freeform optical surfaces accurate at the nanometer level ', Sensors, vol. 21, no. 4, 1103, pp. 1-19 . https://doi.org/10.3390/s21041103
Sensors
Volume 21
Issue 4
Sensors (Basel, Switzerland)
Sensors, Vol 21, Iss 1103, p 1103 (2021)

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bedaa2faff879e1240ca4dee18864a81
http://nbn-resolving.de/urn:nbn:de:bsz:93-opus-ds-126758

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The NPMM-200: large area high resolution for freeform surface measurement

Autor: Christof Pruss, Wolfgang Osten, Christian Schober, Alois Herkommer

Publikováno v: Seventh European Seminar on Precision Optics Manufacturing.

Nanometer resolution metrology is a significant topic in the development and production of complex shaped high precision optics. The Nanopositioning and Nanomeasuring Machine NPMM-200 at ITO is built for nanometer scale positioning in a large scale m

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::c1303fa50c8968eb7351a992f77c6cc9
https://doi.org/10.1117/12.2564918

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