Introduction to a special issue on Frontiers of Aberration Corrected Electron Microscopy in honour of Christian Colliex, Archie Howie and Hannes Lichte on the occasion of their 75th, 85th and 75th birthdays.

Autor: Dunin-Borkowski RE; Ernst Ruska-Centrum für Mikroskopie und Spektroskopie mit Elektronen, Forschungszentrum Jülich GmbH, Germany., Mayer J; Ernst Ruska-Centrum für Mikroskopie und Spektroskopie mit Elektronen, RWTH Aachen, Germany., Sachse C; Ernst Ruska-Centrum für Mikroskopie und Spektroskopie mit Elektronen, Forschungszentrum Jülich GmbH, Germany., Tillmann K; Ernst Ruska-Centrum für Mikroskopie und Spektroskopie mit Elektronen, Forschungszentrum Jülich GmbH, Germany. Electronic address: k.tillmann@fz-juelich.de.

Publikováno v: Ultramicroscopy [Ultramicroscopy] 2019 Aug; Vol. 203, pp. 1. Date of Electronic Publication: 2019 Feb 13.

Introduction to a special issue on Frontiers of Aberration Corrected Electron Microscopy in honour of Christian Colliex, Archie Howie and Hannes Lichte on the occasion of their 75th, 85th and 75th birthdays

Autor: Carsten Sachse, Karsten Tillmann, Joachim Mayer, Rafal E. Dunin-Borkowski

Publikováno v: Ultramicroscopy. 203:1

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::37fd7e03b100cef8138ba611ca594b62
https://doi.org/10.1016/j.ultramic.2019.02.008

Combining Highly Monochromatized EELS with CL for Probing Elementary Excitations and Their Interaction

Autor: Nathalie Brun, Christian Colliex, Marta de Frutors, Mathieu Kociak, Xiaoyan Li, Odile Stéphan, Laura Bocher, Alberto Zobelli, Marcel Tencé, Luiz H. G. Tizei, Jean-Denis Blazit, Alexandre Gloter

Publikováno v: Microscopy and Microanalysis. 26:1502-1504

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::5a74f40e3eaeceb29fe3c9263109e966
https://doi.org/10.1017/s1431927620018334

From early to present and future achievements of EELS in the TEM

Autor: Christian Colliex

Publikováno v: The European Physical Journal Applied Physics. 97:38

This paper reviews the implementation of Electron Energy Loss Spectroscopy (EELS) in a Transmission Electron Microscope (TEM), as an essential tool for advanced analytical studies, exhibiting a unique level of performance in terms of spatial resoluti

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::3bfe16f13a7b10014eb7e6587e387dd4
https://doi.org/10.1051/epjap/2022220012

Electron Energy Loss Spectroscopy imaging of surface plasmons at the nanometer scale

Autor: Mathieu Kociak, Christian Colliex, Odile Stéphan

Publikováno v: Ultramicroscopy. 162:A1-A24

Since their first realization, electron microscopes have demonstrated their unique ability to map with highest spatial resolution (sub-atomic in most recent instruments) the position of atoms as a consequence of the strong scattering of the incident

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::df6f1e07bb231a23452a56ca4145b42c
https://doi.org/10.1016/j.ultramic.2015.11.012