2nd international DCC-Conference 01 - 03 March 2022 Proceedings

Autor: Laiz, Héctor, Hackel, Siegfried, Härtig, Frank, Schrader, Thorsten, Shanna, Shanna, Loewe, Jan, Doering, Lutz, Gloger, Benjamin, Jagieniak, Justin, Hutzschenreuter, Daniel, Söylev-Öktem, Gamze, Phuaknoi, Pawat, Mongkolsuttirat, Kittisun, Chantawong, Narin, Limthunyalak, Wasin, Buajarern, Jariya, Hanisch, Robert, Fedchak, James Antony, Choquette, Steven, Rimmer, Caterine, Long, Benjamin, Plante, Raymond, Lippa, Katrice, Camara, Dinis, Saxholm, Sari, Kärkkäinen, Anu, Hemming, Björn, Sairanen, Hannu, Koskinen, Sami, Nummiluikki, Juho, Riska, Kennet, Järnefelt, Tapio, Mustapää, Tuukka, Viitala, Raine, Ijäs, Miikka, Brandt, Jari, Haapalainen, Mikko, Videnoja, Emmi, Banholzer, Karlheinz, Müller-Schöll, Christian, Haller, Julian, Reitzer, Heiko, Kuenz, Eric, Koch, Hans, Lopez-Celis, Jose Armando, Dominguez-Mendoza, Itzel, Galvan-Hernandez, Carlos, Garcia-Gonzalez, Aldo, Gasca Aragon, Hugo, Ramos-Monsalvo, Oscar, Kuster, Mark, Tobola, Andreas, Bernien, Matthias, Bock, Thomas, Niepraschk, Rolf, Jousten, Karl, Matamala, Antonio, Proskurin, Pavel, Engel, Thomas, Smith, Ian, Stotz, Maik, Stobe, Caroline, Röske, Dirk, Schwartz, Schwartz Michael L., Cenker, Greg, Kuch, Susanne, Kirmes, Raoul, Witt, Florian, Bakri, Saad Ali Haj, Al-Rahali, Talaat, Busser, Lisa, Xiong, Xingchuang, Brown, Robert, Morse, Ed, Krah, Thomas

PTB organized the second International DCC Conference from 01 to 03 March 2022. The conference was held as an all-digital event. The technical scope of the conference focused on current advances of the Digital Calibration Certificate (DCC), the use o

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::b7f861f45b95b3569361c833c718f14b

NIST Reference Materials: Utility and Future.

Autor: Choquette, Steven J., Duewer, David L., Sharpless, Katherine E.

Publikováno v: Annual Review of Analytical Chemistry; Jun2020, Vol. 13, p453-474, 16p

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The application of planar optical waveguides to absorption spectrometry in flow injection analysis

Autor: Choquette, Steven Joseph

Attenuated total reflection techniques have been used extensively as analytical tools for the analysis of thin films and analytes imbedded in complex scattering matrices. However they have not been commonly utilized as detectors in common analytical

Externí odkaz: http://hdl.handle.net/10919/53932

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