Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Choongpyo Jeon"'
Autor:
Kwangwon Seo, Keunho Rhew, Choongpyo Jeon, Youngsung Choi, Jinsoo Bae, Yuchul Hwang, Hoosung Kim, Sangwoo Pae
Publikováno v:
2022 IEEE 72nd Electronic Components and Technology Conference (ECTC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2bbbb0a46651d168dc4e63cb3f712d79
https://doi.org/10.1109/ectc51906.2022.00278
https://doi.org/10.1109/ectc51906.2022.00278
Publikováno v:
2021 IEEE 71st Electronic Components and Technology Conference (ECTC).
Solid state drive (SSD) is widely used for modern computing systems. As design of systems becomes more complex, concern for thermal fatigue lifetime has enlarged by increasing thermo-mechanical stress. Thermal cycling test (TCT) is the most common an
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ce5ecdb2e1d6aeeaa4e5ec58bf1f8ba4
https://doi.org/10.1109/ectc32696.2021.00165
https://doi.org/10.1109/ectc32696.2021.00165
Publikováno v:
2019 International Symposium on Electromagnetic Compatibility - EMC EUROPE.
Recently, there has been growing interest regarding electrostatic discharge (ESD) failures of semiconductors in electronic devices. A system-level ESD test method based on the IEC61000-4-2 standard is widely used today. There is a need, however, for
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b4b077f0f5260224504ce0055be589a3
https://doi.org/10.1109/emceurope.2019.8871627
https://doi.org/10.1109/emceurope.2019.8871627
Publikováno v:
2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC).
As components or products become more reliable, the failure by electro static discharge (ESD) is getting one of the most important problems. In the past, ESD was recognized as a system-level problem. However, it has recently been recognized as a comp
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b66a184571288e4ca29b2b76a8358eec
https://doi.org/10.23919/emctokyo.2019.8893672
https://doi.org/10.23919/emctokyo.2019.8893672
Publikováno v:
2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC).
In the event of failure to control interference from parts to antennas, the mobile systems cannot perform properly. Also, the EMI certification tests cannot be passed. An effective way to reduce the EMI radiation from components is using a metallic s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::10e01abb207eb9b828f95de7c2f667ac
https://doi.org/10.1109/isemc.2018.8393794
https://doi.org/10.1109/isemc.2018.8393794
Publikováno v:
2016 URSI Asia-Pacific Radio Science Conference (URSI AP-RASC).
It is well known that the system-level ESD tests suffer from poor reproducibility. Reproducibility problems appear in various cases; in different systems and the different ESD guns, even if the ESD test conducted using the same systems and ESD guns.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::262ed3d40a04051f3cfd2c200a8e2219
https://doi.org/10.1109/ursiap-rasc.2016.7601323
https://doi.org/10.1109/ursiap-rasc.2016.7601323
Publikováno v:
2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC).
System-level ESD test is conducted into laptop using three different ESD generators. It is observed there is a large variation in ESD test result even if the same ESD generator is used. The current waveform from the ESD generator is a unique individu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6caa3c61910778ecd138eddfe3b39592
https://doi.org/10.1109/apemc.2016.7523036
https://doi.org/10.1109/apemc.2016.7523036
Publikováno v:
2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC); 2016, p289-291, 3p
Publikováno v:
2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC); 2016, p1-40, 40p